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Refinado por: Nome da Publicação: Journal Of Applied Physics remover assunto: Silicon remover Materials Science remover
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1
Supersaturating silicon with transition metals by ion implantation and pulsed laser melting
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Supersaturating silicon with transition metals by ion implantation and pulsed laser melting

Recht, Daniel ; Smith, Matthew J. ; Charnvanichborikarn, Supakit ; Sullivan, Joseph T. ; Winkler, Mark T. ; Mathews, Jay ; Warrender, Jeffrey M. ; Buonassisi, Tonio ; Williams, James S. ; Gradečak, Silvija ; Aziz, Michael J.

Journal of applied physics, 2013-09, Vol.114 (12) [Periódico revisado por pares]

United States

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2
On the role of surface plasmon polaritons in the formation of laser-induced periodic surface structures upon irradiation of silicon by femtosecond-laser pulses
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On the role of surface plasmon polaritons in the formation of laser-induced periodic surface structures upon irradiation of silicon by femtosecond-laser pulses

Bonse, Jörn ; Rosenfeld, Arkadi ; Krüger, Jörg

Journal of applied physics, 2009-11, Vol.106 (10), p.104910-104910-5 [Periódico revisado por pares]

United States: American Institute of Physics

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3
Luminescence properties of defects in GaN
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Luminescence properties of defects in GaN

Reshchikov, Michael A. ; Morkoç, Hadis

Journal of applied physics, 2005-03, Vol.97 (6), p.061301-061301-95 [Periódico revisado por pares]

United States: American Institute of Physics

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4
The Seebeck coefficient and phonon drag in silicon
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The Seebeck coefficient and phonon drag in silicon

Mahan, G. D. ; Lindsay, L. ; Broido, D. A.

Journal of applied physics, 2014-12, Vol.116 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Possible surface plasmon polariton excitation under femtosecond laser irradiation of silicon
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Possible surface plasmon polariton excitation under femtosecond laser irradiation of silicon

Derrien, Thibault J.-Y. ; Itina, Tatiana E. ; Torres, Rémi ; Sarnet, Thierry ; Sentis, Marc

Journal of applied physics, 2013-08, Vol.114 (8) [Periódico revisado por pares]

United States: American Institute of Physics

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6
In situ measurements of non-equilibrium positron state defects during He irradiation in Si
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In situ measurements of non-equilibrium positron state defects during He irradiation in Si

Auguste, R. ; Liedke, M. O. ; Butterling, M. ; Uberuaga, B. P. ; Selim, F. A. ; Wagner, A. ; Hosemann, P.

Journal of applied physics, 2023-05, Vol.133 (18) [Periódico revisado por pares]

Melville: American Institute of Physics

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7
Thermal conductivity of strained silicon: Molecular dynamics insight and kinetic theory approach
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Thermal conductivity of strained silicon: Molecular dynamics insight and kinetic theory approach

Kuryliuk, Vasyl ; Nepochatyi, Oleksii ; Chantrenne, Patrice ; Lacroix, David ; Isaiev, Mykola

Journal of applied physics, 2019-08, Vol.126 (5) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
Field emission from vertically aligned few-layer graphene
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Field emission from vertically aligned few-layer graphene

Malesevic, Alexander ; Kemps, Raymond ; Vanhulsel, Annick ; Chowdhury, Manish Pal ; Volodin, Alexander ; Van Haesendonck, Chris

Journal of applied physics, 2008-10, Vol.104 (8), p.084301-084301-5 [Periódico revisado por pares]

United States: American Institute of Physics

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9
Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon
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Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon

Wilking, S. ; Ebert, S. ; Herguth, A. ; Hahn, G.

Journal of applied physics, 2013-11, Vol.114 (19) [Periódico revisado por pares]

Melville: American Institute of Physics

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10
The role of amorphous silicon and tunneling in heterojunction with intrinsic thin layer (HIT) solar cells
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The role of amorphous silicon and tunneling in heterojunction with intrinsic thin layer (HIT) solar cells

Kanevce, Ana ; Metzger, Wyatt K.

Journal of applied physics, 2009-05, Vol.105 (9), p.094507-094507-7 [Periódico revisado por pares]

United States: American Institute of Physics

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