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gm/Id Analysis of vertical nanowire III–V TFETs
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gm/Id Analysis of vertical nanowire III–V TFETs

Rangasamy, Gautham ; Zhu, Zhongyunshen ; Ohlsson Fhager, Lars ; Wernersson, Lars-Erik

Electronics letters, 2023-09, Vol.59 (18) [Peer Reviewed Journal]

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2
Topological Performance Measures as Surrogates for Physical Flow Models for Risk and Vulnerability Analysis for Electric Power Systems
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Topological Performance Measures as Surrogates for Physical Flow Models for Risk and Vulnerability Analysis for Electric Power Systems

LaRocca, Sarah ; Johansson, Jonas ; Hassel, Henrik ; Guikema, Seth

Risk analysis, 2015-04, Vol.35 (4), p.608-623 [Peer Reviewed Journal]

United States: Blackwell Publishing Ltd

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3
Comparison of different modeling approaches to better evaluate greenhouse gas emissions from whole wastewater treatment plants
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Comparison of different modeling approaches to better evaluate greenhouse gas emissions from whole wastewater treatment plants

Corominas, Lluís ; Flores-Alsina, Xavier ; Snip, Laura ; Vanrolleghem, Peter A.

Biotechnology and bioengineering, 2012-11, Vol.109 (11), p.2854-2863 [Peer Reviewed Journal]

Hoboken: Wiley Subscription Services, Inc., A Wiley Company

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4
3D‐Printed Soft Lithography for Complex Compartmentalized Microfluidic Neural Devices
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3D‐Printed Soft Lithography for Complex Compartmentalized Microfluidic Neural Devices

Kajtez, Janko ; Buchmann, Sebastian ; Vasudevan, Shashank ; Birtele, Marcella ; Rocchetti, Stefano ; Pless, Christian Jonathan ; Heiskanen, Arto ; Barker, Roger A. ; Martínez‐Serrano, Alberto ; Parmar, Malin ; Lind, Johan Ulrik ; Emnéus, Jenny

Advanced science, 2020-08, Vol.7 (16), p.2001150-n/a [Peer Reviewed Journal]

Germany: John Wiley & Sons, Inc

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5
A Biomimetic Evolvable Organic Electrochemical Transistor
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A Biomimetic Evolvable Organic Electrochemical Transistor

Gerasimov, Jennifer Y. ; Zhao, Dan ; Sultana, Ayesha ; Abrahamsson, Tobias ; Han, Shaobo ; Bliman, David ; Tu, Deyu ; Simon, Daniel T. ; Olsson, Roger ; Crispin, Xavier ; Berggren, Magnus ; Fabiano, Simone

Advanced electronic materials, 2021-11, Vol.7 (11), p.n/a [Peer Reviewed Journal]

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6
Optimal frequency combination estimation for accurate ultrasound non-destructive testing
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Optimal frequency combination estimation for accurate ultrasound non-destructive testing

Kumar, A ; Shakya, S ; Goswami, M

Electronics letters, 2020-09, Vol.56 (19), p.1022-1024 [Peer Reviewed Journal]

The Institution of Engineering and Technology

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7
Understanding the mechanical limitations of the performance of soft X‐ray monochromators at MAX IV laboratory
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Understanding the mechanical limitations of the performance of soft X‐ray monochromators at MAX IV laboratory

Sjöblom, Peter ; Todorescu, Gabriela ; Urpelainen, Samuli

Journal of synchrotron radiation, 2020-03, Vol.27 (2), p.272-283 [Peer Reviewed Journal]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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8
Multiple‐load wireless power transmission system through time‐division multiplexed resonators
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Multiple‐load wireless power transmission system through time‐division multiplexed resonators

Ghotbi, Iman ; Sarfaraz, Hossein

International journal of circuit theory and applications, 2021-05, Vol.49 (5), p.1225-1243 [Peer Reviewed Journal]

Bognor Regis: Wiley Subscription Services, Inc

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9
Directed Self‐Assembly for Dense Vertical III–V Nanowires on Si and Implications for Gate All‐Around Deposition
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Directed Self‐Assembly for Dense Vertical III–V Nanowires on Si and Implications for Gate All‐Around Deposition

Löfstrand, Anette ; Jafari Jam, Reza ; Svensson, Johannes ; Jönsson, Adam ; Menon, Heera ; Jacobsson, Daniel ; Wernersson, Lars‐Erik ; Maximov, Ivan

Advanced electronic materials, 2022-09, Vol.8 (9), p.n/a [Peer Reviewed Journal]

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10
State‐space models and stored electromagnetic energy for antennas in dispersive and heterogeneous media
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State‐space models and stored electromagnetic energy for antennas in dispersive and heterogeneous media

Gustafsson, Mats ; Ehrenborg, Casimir

Radio science, 2017-11, Vol.52 (11), p.1325-1343 [Peer Reviewed Journal]

Washington: Blackwell Publishing Ltd

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