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1 |
Material Type: Artigo
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LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA ImplicationsGarcia Alia, Ruben ; Brugger, Markus ; Cerutti, Francesco ; Danzeca, Salvatore ; Ferrari, Alfredo ; Gilardoni, Simone ; Kadi, Yacine ; Kastriotou, Maria ; Lechner, Anton ; Martinella, Corinna ; Stein, Oliver ; Thurel, Yves ; Tsinganis, Andrea ; Uznanski, SlawoszIEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.448-456 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Radiation Environment in the LHC Arc Sections During Run 2 and Future HL-LHC OperationsBilko, Kacper ; Castro, Cristina Bahamonde ; Brugger, Markus ; Alia, Ruben Garcia ; Kadi, Yacine ; Lechner, Anton ; Lerner, Giuseppe ; Stein, OliverIEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1682-1690 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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A Reconfigurable Neural Network ASIC for Detector Front-End Data Compression at the HL-LHCGuglielmo, Giuseppe Di ; Fahim, Farah ; Herwig, Christian ; Valentin, Manuel Blanco ; Duarte, Javier ; Gingu, Cristian ; Harris, Philip ; Hirschauer, James ; Kwok, Martin ; Loncar, Vladimir ; Luo, Yingyi ; Miranda, Llovizna ; Ngadiuba, Jennifer ; Noonan, Daniel ; Ogrenci-Memik, Seda ; Pierini, Maurizio ; Summers, Sioni ; Tran, NhanIEEE transactions on nuclear science, 2021-08, Vol.68 (8), p.2179-2186 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Prototype Design of Global Common Module for ATLAS Experiment's Phase-II UpgradeTang, S. ; Bonini, F. ; Begel, M. ; Benoit, M. ; Chen, H. ; Filimonov, V. ; Lucca, F. ; Matakias, D. ; Qian, W. ; Sankey, D. ; Xu, H.IEEE transactions on nuclear science, 2023-09, Vol.70 (9), p.1-1 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Design And Commissioning Of The First 32 Tbit/s Event-BuilderPisani, Flavio ; Colombo, Tommaso ; Durante, Paolo ; Frank, Markus ; Gaspar, Clara ; Cardoso, Luis Granado ; Neufeld, Niko ; Perro, AlbertoIEEE transactions on nuclear science, 2023-06, Vol.70 (6), p.1-1 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Ionizing Radiation Effects in Silicon Photonics ModulatorsLalovic, Milana ; Scarcella, Carmelo ; Bulling, Anthony ; Detraz, Stephane ; Marcon, Leonardo ; Olantera, Lauri ; Prousalidi, Theoni ; Sandven, Ulrik ; Sigaud, Christophe ; Soos, Csaba ; Troska, JanIEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1521-1526 [Periódico revisado por pares]New York: IEEETexto completo disponível |
7 |
Material Type: Artigo
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Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA ImplicationsBilko, Kacper ; Alia, Ruben Garcia ; Aguiar, Ygor ; Danzeca, Salvatore ; Francesca, Diego Di ; Gilardoni, Simone ; Girard, Sylvain ; Ricci, Daniel ; Sebban, Marc ; Uznanski, SlawoszIEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.607-617 [Periódico revisado por pares]New York: IEEETexto completo disponível |
8 |
Material Type: Artigo
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System Design and Prototyping for the CMS Level-1 Trigger at the High-Luminosity LHCKumar, P. ; Gomber, B.IEEE transactions on nuclear science, 2023-06, Vol.70 (6), p.1075-1082 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Effects of Bias and Temperature on the Dose-Rate Sensitivity of 65-nm CMOS TransistorsBorghello, Giulio ; Faccio, Federico ; Termo, Gennaro ; Michelis, Stefano ; Costanzo, Sebastiano ; Koch, Henri D. ; Fleetwood, Daniel M.IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.573-580 [Periódico revisado por pares]New York: IEEETexto completo disponível |
10 |
Material Type: Artigo
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Optimization of the 65-nm CMOS Linear Front-End Circuit for the CMS Pixel Readout at the HL-LHCGaioni, L. ; Manghisoni, M. ; Ratti, L. ; Re, V. ; Riceputi, E. ; Traversi, G. ; Dellacasa, G. ; Demaria, N. ; Garbolino, S. ; Rotondo, F.IEEE transactions on nuclear science, 2021-11, Vol.68 (11), p.2682-2692 [Periódico revisado por pares]New York: IEEETexto completo disponível |