skip to main content
Primo Advanced Search
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search prefilters
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Local tuning of photonic crystal cavities using chalcogenide glasses
Material Type:
Artigo
Adicionar ao Meu Espaço

Local tuning of photonic crystal cavities using chalcogenide glasses

Faraon, A. ; Englund, D. ; Bulla, D. ; Luther-Davies, B. ; Eggleton, B.J. ; Stoltz, N. ; Petroff, P. ; Vuckovic, J.

2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science, 2008-01, Vol.92 (4), p.1-2 [Periódico revisado por pares]

IEEE

Texto completo disponível

2
Integration of site-controlled pyramidal quantum dots and photonic crystal membrane cavities
Material Type:
Artigo
Adicionar ao Meu Espaço

Integration of site-controlled pyramidal quantum dots and photonic crystal membrane cavities

Gallo, P. ; Felici, M. ; Dwir, B. ; Atlasov, K. ; Karlsson, K.F. ; Rudra, A. ; Mohan, A. ; Biasiol, G. ; Sorba, L. ; Kapon, E.

2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science, 2008-06, Vol.92 (26), p.1-2 [Periódico revisado por pares]

IEEE

Texto completo disponível

3
Limiting nature of continuum generation in silicon
Material Type:
Artigo
Adicionar ao Meu Espaço

Limiting nature of continuum generation in silicon

Koonath, P. ; Solli, D.R. ; Jalali, B.

2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science, 2008-09, Vol.93 (9), p.1-2 [Periódico revisado por pares]

IEEE

Texto completo disponível

4
Fiber taper coupling to chalcogenide microsphere modes
Material Type:
Artigo
Adicionar ao Meu Espaço

Fiber taper coupling to chalcogenide microsphere modes

Grillet, C. ; Magi, E. ; Eggleton, B.J.

2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science, 2008-04, Vol.92 (17), p.1-2 [Periódico revisado por pares]

United States: IEEE

Texto completo disponível

Buscando em bases de dados remotas. Favor aguardar.