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Temperature Profiles Induced by Recrystallization of Silicon-on-Insulator with Scanning Incoherent Light Line SourceHoeppner, K. ; Richter, H.H. ; Joachim, O. ; Tillack, Bernd ; Banisch, R. ; Weinelt, W. ; Andrä, H.Solid state phenomena, 1991-01, Vol.19-20, p.631-638 [Periódico revisado por pares]Trans Tech Publications LtdTexto completo disponível |