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Refinado por: Nome da Publicação: Journal Of Applied Physics remover
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1
Semiconducting and other major properties of gallium arsenide
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Semiconducting and other major properties of gallium arsenide

Blakemore, J S

Journal of applied physics, 1982-10, Vol.53 (10), p.R123-R181 [Periódico revisado por pares]

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2
Experimental requirements for quantitative mapping of midgap flaw concentration in semi-insulating GaAs wafers by measurement of near-infrared transmittance
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Experimental requirements for quantitative mapping of midgap flaw concentration in semi-insulating GaAs wafers by measurement of near-infrared transmittance

DOBRILLA, P ; BLAKEMORE, J. S

Journal of applied physics, 1985-07, Vol.58 (1), p.208-218 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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3
Mid-infrared dispersion of the refractive index and reflectivity for GaAs
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Mid-infrared dispersion of the refractive index and reflectivity for GaAs

BLAKEMORE, J. S

Journal of applied physics, 1987-12, Vol.62 (11), p.4528-4532 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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4
Transient photoconductivity measurements in semi-insulating GaAs. I: An analog approach
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Transient photoconductivity measurements in semi-insulating GaAs. I: An analog approach

KREMER, R. E ; ARIKAN, M. C ; ABELE, J. C ; BLAKEMORE, J. S

Journal of applied physics, 1987-09, Vol.62 (6), p.2424-2431 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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5
Transient photoconductivity measurements in semi-insulating GaAs II: A digital approach
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Transient photoconductivity measurements in semi-insulating GaAs II: A digital approach

ABELE, J. C ; KREMER, R. E ; BLAKEMORE, J. S

Journal of applied physics, 1987-09, Vol.62 (6), p.2432-2438 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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6
Mapping of GaAs wafers by quantitative infrared microscopy
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Mapping of GaAs wafers by quantitative infrared microscopy

DOBRILLA, P ; BLAKEMORE, J. S

Journal of applied physics, 1987-02, Vol.61 (4), p.1442-1448 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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7
Melt-grown p-type GaAs with iron doping
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Melt-grown p-type GaAs with iron doping

TANG, R.-S ; SABAN, S. B ; BLAKEMORE, J. S ; GRAY, M. L

Journal of applied physics, 1993-06, Vol.73 (11), p.7416-7421 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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8
Compensation assessment in «undoped» high-resistivity GaAs
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Compensation assessment in «undoped» high-resistivity GaAs

TANG, R.-S ; SARGENT, L ; BLAKEMORE, J. S

Journal of applied physics, 1989-07, Vol.66 (1), p.256-261 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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9
Factors affecting the spatial distribution of the principal midgap donor in semi-insulating gallium arsenide wafers
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Factors affecting the spatial distribution of the principal midgap donor in semi-insulating gallium arsenide wafers

BLAKEMORE, J. S ; DOBRILLA, P

Journal of applied physics, 1985-07, Vol.58 (1), p.204-207 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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10
Iron doped bulk semi-insulating GaAs
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Iron doped bulk semi-insulating GaAs

GRAY, M. L ; PETERSON, L ; TANG, R.-S ; SABAN, S. B ; BLAKEMORE, J. S

Journal of applied physics, 1993-04, Vol.73 (7), p.3319-3325 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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