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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Ata de Congresso
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A Context-Based Automated Approach for Method Name Consistency Checking and SuggestionLi, Yi ; Wang, Shaohua ; Nguyen, Tien2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.574-586IEEETexto completo disponível |
| 2 |
Material Type: Ata de Congresso
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Identifying and Characterizing Silently-Evolved Methods in the Android APILiu, Pei ; Li, Li ; Yan, Yichun ; Fazzini, Mattia ; Grundy, John2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2021, p.308-317IEEETexto completo disponível |
| 3 |
Material Type: Ata de Congresso
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Evaluating SZZ Implementations Through a Developer-Informed OracleRosa, Giovanni ; Pascarella, Luca ; Scalabrino, Simone ; Tufano, Rosalia ; Bavota, Gabriele ; Lanza, Michele ; Oliveto, Rocco2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.436-447IEEETexto completo disponível |
| 4 |
Material Type: Ata de Congresso
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AUTOTRAINER: An Automatic DNN Training Problem Detection and Repair SystemZhang, Xiaoyu ; Zhai, Juan ; Ma, Shiqing ; Shen, Chao2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.359-371IEEETexto completo disponível |
| 5 |
Material Type: Ata de Congresso
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Trace-Checking CPS Properties: Bridging the Cyber-Physical GapMenghi, Claudio ; Vigano, Enrico ; Bianculli, Domenico ; Briand, Lionel C.2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.847-859IEEETexto completo disponível |
| 6 |
Material Type: Ata de Congresso
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Software Ticks Need No SpecificationsReichenbach, Christoph2021 IEEE/ACM 43rd International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER), 2021, p.61-65IEEETexto completo disponível |
| 7 |
Material Type: Ata de Congresso
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White-Box Performance-Influence Models: A Profiling and Learning ApproachWeber, Max ; Apel, Sven ; Siegmund, Norbert2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1059-1071IEEETexto completo disponível |
| 8 |
Material Type: Ata de Congresso
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Automatic Solution Summarization for Crash BugsWang, Haoye ; Xia, Xin ; Lo, David ; Grundy, John ; Wang, Xinyu2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1286-1297IEEETexto completo disponível |
| 9 |
Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |
| 10 |
Material Type: Ata de Congresso
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FLACK: Counterexample-Guided Fault Localization for Alloy ModelsZheng, Guolong ; Nguyen, ThanhVu ; Gutierrez Brida, Simon ; Regis, German ; Frias, Marcelo F. ; Aguirre, Nazareno ; Bagheri, Hamid2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.637-648IEEETexto completo disponível |
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