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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Practical guide for curve fitting in x-ray photoelectron spectroscopyMajor, George H. ; Fairley, Neal ; Sherwood, Peter M. A. ; Linford, Matthew R. ; Terry, Jeff ; Fernandez, Vincent ; Artyushkova, KaterynaJournal of vacuum science & technology. A, Vacuum, surfaces, and films, 2020-12, Vol.38 (6) [Periódico revisado por pares]American Vacuum SocietyTexto completo disponível |
| 2 |
Material Type: Artigo
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Pressure field in a tube with a general and arbitrary time- and position-dependent gas sourceF T Degasperi Marcos Nogueira Martins; Jiro Takahashi; Sérgio Luís Lopes VerardiJournal of Vacuum Science & Technology A v. 22, n. 5, p. 2022-2026, 2004New York 2004Acesso online |
| 3 |
Material Type: Artigo
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Effects of arrival rate and gas pressure on the chemical bonding and composition in titanium nitride films prepared on Si(100) substrates by ion beam and vapor depositionMasao Matsuoka 1949- Sadao Isotani; Juan Carlos Ramirez Mittani; Jose Fernando Diniz Chubaci; K Ogata; N KurataniJournal of Vacuum Science & Technology A v. 23, n. 1, p. 137-141, 2005New York 2005Acesso online |
| 4 |
Material Type: Artigo
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Anisotropic resistivity of thin films due to quantum electron scattering from anisotropic surface roughnessMaria Cecília Barbosa da Silveira Salvadori Mauro Sérgio Dorsa Cattani; F S Teixeira; R S Wiederkehr; I G BrownJournal of Vacuum Science & Technology A v. 25, n. 2, p.330-333, 2007New York 2007Acesso online |
| 5 |
Material Type: Artigo
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Practical guides for x-ray photoelectron spectroscopy: Quantitative XPSShard, Alexander G.Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2020-07, Vol.38 (4) [Periódico revisado por pares]Texto completo disponível |
| 6 |
Material Type: Artigo
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XPS guide: Charge neutralization and binding energy referencing for insulating samplesBaer, Donald R. ; Artyushkova, Kateryna ; Cohen, Hagai ; Easton, Christopher D. ; Engelhard, Mark ; Gengenbach, Thomas R. ; Greczynski, Grzegorz ; Mack, Paul ; Morgan, David J. ; Roberts, AdamJournal of vacuum science & technology. A, Vacuum, surfaces, and films, 2020-05, Vol.38 (3) [Periódico revisado por pares]United States: American Vacuum Society / AIPTexto completo disponível |
| 7 |
Material Type: Artigo
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Role of high aspect-ratio thin-film metal deposition in Cu back-end-of-line technologySimon, Andrew ; van der Straten, Oscar ; Lanzillo, Nicholas A. ; Yang, Chih-Chao ; Nogami, Takeshi ; Edelstein, Daniel C.Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2020-09, Vol.38 (5), p.53402 [Periódico revisado por pares]Texto completo disponível |
| 8 |
Material Type: Artigo
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Review of virtual substrate technologies for 6.3 Ångström lattice constantsSvensson, Stefan P. ; Mahadik, Nadeemullah A. ; Kipshidze, Gela ; Donetski, Dmitri ; Zhao, Jingze ; Belenky, GregoryJournal of Vacuum Science & Technology A, 2023-07, Vol.41 (4) [Periódico revisado por pares]Texto completo disponível |
| 9 |
Material Type: Artigo
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Searching for superconductivity in high entropy oxide Ruddlesden–Popper cuprate filmsMazza, Alessandro R. ; Gao, Xingyao ; Rossi, Daniel J. ; Musico, Brianna L. ; Valentine, Tyler W. ; Kennedy, Zachary ; Zhang, Jie ; Lapano, Jason ; Keppens, Veerle ; Moore, Robert G. ; Brahlek, Matthew ; Rost, Christina M. ; Ward, Thomas Z.Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2022-01, Vol.40 (1) [Periódico revisado por pares]United States: American Vacuum SocietyTexto completo disponível |
| 10 |
Material Type: Artigo
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Selecting the best surface analysis method for your materials/samplesRobinson, Kye J. ; Thissen, HelmutJournal of Vacuum Science & Technology A, 2024-07, Vol.42 (4) [Periódico revisado por pares]Texto completo disponível |
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