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Material Type: Artigo
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A time complexity gap for two-way probabilistic finite-state automataDWORK, C ; STOCKMEYER, LSIAM journal on computing, 1990-12, Vol.19 (6), p.1011-1023 [Periódico revisado por pares]Philadelphia, PA: Society for Industrial and Applied MathematicsTexto completo disponível |
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Material Type: Artigo
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Multi-agent approach and stochastic optimization: random events in manufacturing systemsFleury, Gerard ; Goujon, Jean-Yves ; GOURGAND, MICHEL ; Lacomme, PhilippeJournal of intelligent manufacturing, 1999-03, Vol.10 (1), p.81 [Periódico revisado por pares]London: Springer Nature B.VTexto completo disponível |
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Material Type: Artigo
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Cumulative Causation and Industrial Evolution: Kaldor's Four Stages of Industrialization as an Evolutionary ModelArgyrous, GeorgeJournal of economic issues, 1996-03, Vol.30 (1), p.97-119 [Periódico revisado por pares]Sacramento, Calif: RoutledgeTexto completo disponível |
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Material Type: Artigo
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A retrospective on the VAX VMM security kernelKarger, P.A. ; Zurko, M.E. ; Bonin, D.W. ; Mason, A.H. ; Kahn, C.E.IEEE transactions on software engineering, 1991-11, Vol.17 (11), p.1147-1165 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Pac-learning Recursive Logic Programs: Negative ResultsCohen, W. W.The Journal of artificial intelligence research, 1994-01, Vol.2, p.541-573 [Periódico revisado por pares]San Francisco: AI Access FoundationTexto completo disponível |
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Material Type: Artigo
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Architectural issues in the design and implementation of an integrated toolkit for manufacturing engineeringBrown, A. W. ; Judd, R. P. ; Riddick, F.International journal of computer integrated manufacturing, 1997-01, Vol.10 (1-4), p.142-159 [Periódico revisado por pares]Taylor & Francis GroupTexto completo disponível |
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Material Type: Artigo
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Common sense: a middle way between formalism and post-structuralism?Davis, John B.Cambridge Journal of Economics, 1999-07, Vol.23 (4), p.503-513 [Periódico revisado por pares]Oxford: Oxford University PressTexto completo disponível |
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Material Type: Artigo
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Near-testable setsGOLDSMITH, J ; HEMACHANDRA, L. A ; JOSEPHI, D ; YOUNG, PSIAM journal on computing, 1991-06, Vol.20 (3), p.506-523 [Periódico revisado por pares]Philadelphia, PA: Society for Industrial and Applied MathematicsTexto completo disponível |
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Material Type: Ata de Congresso
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Self-testing of universal and fault-tolerant sets of quantum gatesvan Dam, Wim ; Magniez, Frédéic ; Mosca, Michele ; Santha, MiklosAnnual ACM Symposium on Theory of Computing: Proceedings of the thirty-second annual ACM symposium on Theory of computing; 21-23 May 2000, 2000, p.688-696 [Periódico revisado por pares]New York, NY, USA: ACMTexto completo disponível |
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Material Type: Artigo
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BiographiesWeiss, Eric AIEEE annals of the history of computing, 1988-10, Vol.10 (4), p.348 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |