Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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11 |
Material Type: Artigo
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Planning, timing, and funding: profile of the Santa Monica College Library and Resource CenterAaron, Letitia K ; Cassell, William K ; Nyquist, Norman GCommunity & junior college libraries, 1984-07, Vol.2 (4) [Periódico revisado por pares]Sem texto completo |
12 |
Material Type: Artigo
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How to Identify a Bathtub Hazard RateAarset, Magne VollanIEEE transactions on reliability, 1987-04, Vol.R-36 (1), p.106-108 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
13 |
Material Type: Livro
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PARLE '91 Parallel Architectures and Languages Europe: Volume I: Parallel Architectures and Algorithms Eindhoven, The Netherlands, June 10–13, 1991 ProceedingsAarts, Emile H. L ; Leeuwen, Jan van ; Rem, MartinBerlin, Heidelberg: Springer Berlin Heidelberg 1991Texto completo disponível |
14 |
Material Type: Livro
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Parle '91 Parallel Architectures and Languages Europe: Volume I: Parallel Architectures and Algorithms Eindhoven, the Netherlands, June 10-13, 1991 ProceedingsAarts, Emile H. L ; van Leeuwen, Jan ; Rem, Martin Aarts, Emile H. L. ; Rem, Martin ; van Leeuwen, JanBerlin, Heidelberg: Springer Berlin / Heidelberg 1987Texto completo disponível |
15 |
Material Type: Artigo
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Parallel implementations of the statistical cooling algorithmAarts, Emile H.L. ; de Bont, Frans M.J. ; Habers, Erik H.A. ; van Laarhoven, Peter J.M.Integration (Amsterdam), 1986-09, Vol.4 (3), p.209-238 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
16 |
Material Type: Artigo
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Portable computers, a buyers' guideAartsen, MDesign (London), 1984-03, p.48-57Sem texto completo |
17 |
Material Type: Artigo
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Statistical Evaluation of Learning Factor in Reliability StudiesAbadeer, W. W.IEEE transactions on reliability, 1980-12, Vol.R-29 (5), p.414-415 [Periódico revisado por pares]IEEETexto completo disponível |
18 |
Material Type: Tese
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The role of model simulations in architectural education with particular reference to the development of spatial design abilityAbadi, IUniversity of PortsmouthSem texto completo |
19 |
Material Type: Artigo
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Test Schedules for VLSI Circuits Having Built-In Test HardwareAbadir, M S ; Breuer, M AIEEE transactions on computers, 1986-04, Vol.C-35 (4), p.361-367 [Periódico revisado por pares]IEEETexto completo disponível |
20 |
Material Type: Artigo
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LSI Testing TechniquesAbadir, M. S. ; Reghbati, H. K.IEEE MICRO, 1983-01, Vol.3 (1), p.34-51 [Periódico revisado por pares]IEEETexto completo disponível |