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Refinado por: Nome da Publicação: Journal Of Applied Physics remover
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1
Magnetothermal properties of CoO2 monolayer from first-principles and Monte Carlo simulations
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Magnetothermal properties of CoO2 monolayer from first-principles and Monte Carlo simulations

Xu, Xing-Long ; Hu, Cui-E. ; Wu, Hao-Jia ; Geng, Hua-Yun ; Chen, Xiang-Rong

Journal of applied physics, 2024-06, Vol.135 (21) [Periódico revisado por pares]

Melville: American Institute of Physics

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Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy
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Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy

Jena, S. ; Urkude, R. ; Choi, W.-Y. ; Pandey, K. K. ; Karwal, S. ; Jung, M. H. ; Gardner, J. ; Ghosh, B. ; Singh, V. R.

Journal of applied physics, 2024-04, Vol.135 (16) [Periódico revisado por pares]

Melville: American Institute of Physics

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3
Measurement and modeling of strain waves in germanium induced by ultrafast laser pulses
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Measurement and modeling of strain waves in germanium induced by ultrafast laser pulses

Aagaard, Martin ; Julsgaard, Brian

Journal of applied physics, 2024-04, Vol.135 (16) [Periódico revisado por pares]

Melville: American Institute of Physics

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4
High thermoelectric performance in Ti2OX2 (X = F, Cl) MOene: A first-principles study incorporating electron–phonon coupling
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High thermoelectric performance in Ti2OX2 (X = F, Cl) MOene: A first-principles study incorporating electron–phonon coupling

Wan, Yu-Lu ; Yang, Qiu ; Zhang, Tian ; Zeng, Zhao-Yi ; Chen, Xiang-Rong

Journal of applied physics, 2024-03, Vol.135 (12) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2O3 dielectric layers
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Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2O3 dielectric layers

Obeid, B. ; Bastard, L. ; Bouchard, A. ; Aubriet, V. ; Jouannic, K. ; Le Cunff, D. ; Gourhant, O. ; Ionica, I.

Journal of applied physics, 2024-03, Vol.135 (9) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Thermal conductivity of group IV elemental semiconductors
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Thermal conductivity of group IV elemental semiconductors

Inyushkin, A. V.

Journal of applied physics, 2023-12, Vol.134 (22) [Periódico revisado por pares]

Melville: American Institute of Physics

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7
The laser-induced rearrangement of extended defects in crystalline CdTe at a low temperature
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The laser-induced rearrangement of extended defects in crystalline CdTe at a low temperature

Krivobok, V. S. ; Nikolaev, S. N. ; Klokov, A. Yu ; Sharkov, A. I. ; Chentsov, S. I. ; Usmanov, I. I. ; Mironchuk, E. S.

Journal of applied physics, 2023-11, Vol.134 (17) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
Optoacoustic detection of nanosecond time scale photoinduced lensing effects in liquids
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Optoacoustic detection of nanosecond time scale photoinduced lensing effects in liquids

Bergmann, E. V. ; Lukasievicz, G. V. B. ; Lendl, B. ; Sampaio, A. R. ; Zanuto, V. S. ; Baesso, M. L. ; Malacarne, L. C. ; Astrath, N. G. C.

Journal of applied physics, 2023-10, Vol.134 (16) [Periódico revisado por pares]

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9
Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance
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Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance

IJpes, D. ; Yakshin, A. E. ; Sturm, J. M. ; Ackermann, M. D.

Journal of applied physics, 2023-06, Vol.133 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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10
Thermal characterization of n-type silicon based on an electro-acoustic analogy
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Thermal characterization of n-type silicon based on an electro-acoustic analogy

Stanojevic, N. ; Markushev, D. K. ; Aleksić, S. M. ; Pantić, D. S. ; Galović, S. P. ; Markushev, D. D. ; Ordonez-Miranda, J.

Journal of applied physics, 2023-06, Vol.133 (24), p.245102 [Periódico revisado por pares]

Melville: American Institute of Physics

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