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Refinado por: Nome da Publicação: J. Appl. Phys.; remover assunto: Thin Films remover Journal Of Applied Physics remover
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11
Electron and hole dynamics in amorphous silicon
Electron and hole dynamics in amorphous silicon
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Electron and hole dynamics in amorphous silicon

WERNER, A ; KUNST, M

Journal of applied physics, 1988-07, Vol.64 (1), p.211-217 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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12
Effects of keV electron irradiation on the avalanche-electron generation rates of three donors on oxidized silicon
Effects of keV electron irradiation on the avalanche-electron generation rates of three donors on oxidized silicon
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Effects of keV electron irradiation on the avalanche-electron generation rates of three donors on oxidized silicon

Sah, Chih-Tang ; Sun, Jack Yuan-Chen ; Tzou, Joseph Jeng-Tao

Journal of applied physics, 1983-08, Vol.54 (8), p.4378-4381 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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13
Electron beam induced decomposition of cadmium chloride thin films with potential resist application
Electron beam induced decomposition of cadmium chloride thin films with potential resist application
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Electron beam induced decomposition of cadmium chloride thin films with potential resist application

AIDINIS, C. J ; GREEN, M

Journal of applied physics, 1988-05, Vol.63 (9), p.4397-4405 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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14
Properties of tin doped indium oxide thin films prepared by magnetron sputtering
Properties of tin doped indium oxide thin films prepared by magnetron sputtering
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Properties of tin doped indium oxide thin films prepared by magnetron sputtering

RAY, S ; RATNABALI BANERJEE ; BASU, N ; BATABYAL, A. K ; BARUA, A. K

Journal of applied physics, 1983-06, Vol.54 (6), p.3497-3501 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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15
Structural and morphological investigation of the development of electrical conductivity in ion-irradiated thin films of an organic material
Structural and morphological investigation of the development of electrical conductivity in ion-irradiated thin films of an organic material
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Structural and morphological investigation of the development of electrical conductivity in ion-irradiated thin films of an organic material

LOVINGER, A. J ; FORREST, S. R ; KAPLAN, M. L ; SCHMIDT, P. H ; VENKATESAN, T

Journal of applied physics, 1984-01, Vol.55 (2), p.476-482 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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16
Polar Kerr-effect observation of perpendicular surface anisotropy for ultrathin ferromagnetic films: fcc Fe/Cu(100)
Polar Kerr-effect observation of perpendicular surface anisotropy for ultrathin ferromagnetic films: fcc Fe/Cu(100)
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Polar Kerr-effect observation of perpendicular surface anisotropy for ultrathin ferromagnetic films: fcc Fe/Cu(100)

LIU, C ; MOOG, E. R ; BADER, S. D

Journal of applied physics, 1988-11, Vol.64 (10), p.5325-5327 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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17
Auger electron spectroscopy, transmission electron microscopy, and scanning electron microscopy studies of Nb/Al/Nb Josephson junction structures
Auger electron spectroscopy, transmission electron microscopy, and scanning electron microscopy studies of Nb/Al/Nb Josephson junction structures
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Auger electron spectroscopy, transmission electron microscopy, and scanning electron microscopy studies of Nb/Al/Nb Josephson junction structures

CHANG, C. C ; GURVITCH, M ; HWANG, D. M ; BLONDER, C. W

Journal of applied physics, 1987-06, Vol.61 (11), p.5089-5097 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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18
Kinetics and morphology of erbium silicide formation
Kinetics and morphology of erbium silicide formation
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Kinetics and morphology of erbium silicide formation

KNAPP, J. A ; PICRAUX, S. T ; WU, C. S ; LAU, S. S

Journal of applied physics, 1985-11, Vol.58 (10), p.3747-3757 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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19
Orientation dependence of twinning characteristics in Y-Ba-Cu-O superconducting thin films
Orientation dependence of twinning characteristics in Y-Ba-Cu-O superconducting thin films
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Orientation dependence of twinning characteristics in Y-Ba-Cu-O superconducting thin films

SINGH, R. K ; BIUNNO, N ; NARAYAN, J

Journal of applied physics, 1989-03, Vol.65 (6), p.2398-2401 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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20
A15 Nb-Sn tunnel junction fabrication and properties
A15 Nb-Sn tunnel junction fabrication and properties
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A15 Nb-Sn tunnel junction fabrication and properties

Rudman, D. A. ; Hellman, F. ; Hammond, R. H. ; Beasley, M. R.

Journal of applied physics, 1984-05, Vol.55 (10), p.3544-3553 [Periódico revisado por pares]

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