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Material Type: Ata de Congresso
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Interface Compliance of Inline Assembly: Automatically Check, Patch and RefineRecoules, Frederic ; Bardin, Sebastien ; Bonichon, Richard ; Lemerre, Matthieu ; Mounier, Laurent ; Potet, Marie-Laure2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1236-1247IEEETexto completo disponível |
12 |
Material Type: Ata de Congresso
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AUTOTRAINER: An Automatic DNN Training Problem Detection and Repair SystemZhang, Xiaoyu ; Zhai, Juan ; Ma, Shiqing ; Shen, Chao2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.359-371IEEETexto completo disponível |
13 |
Material Type: Ata de Congresso
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The influence of organizational structure on software quality: an empirical case studyNagappan, Nachiappan ; Murphy, Brendan ; Basili, VictorInternational Conference on Software Engineering 2008, 2008, Vol.2008 (24), p.521-530New York, NY, USA: ACMTexto completo disponível |
14 |
Material Type: Ata de Congresso
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DepOwl: Detecting Dependency Bugs to Prevent Compatibility FailuresJia, Zhouyang ; Li, Shanshan ; Yu, Tingting ; Zeng, Chen ; Xu, Erci ; Liu, Xiaodong ; Wang, Ji ; Liao, Xiangke2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.86-98IEEETexto completo disponível |
15 |
Material Type: Ata de Congresso
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CURE: Code-Aware Neural Machine Translation for Automatic Program RepairJiang, Nan ; Lutellier, Thibaud ; Tan, Lin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1161-1173IEEETexto completo disponível |
16 |
Material Type: Ata de Congresso
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Trace-Checking CPS Properties: Bridging the Cyber-Physical GapMenghi, Claudio ; Vigano, Enrico ; Bianculli, Domenico ; Briand, Lionel C.2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.847-859IEEETexto completo disponível |
17 |
Material Type: Ata de Congresso
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Fast and Precise On-the-Fly Patch Validation for AllChen, Lingchao ; Ouyang, Yicheng ; Zhang, Lingming2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1123-1134IEEETexto completo disponível |
18 |
Material Type: Ata de Congresso
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Software ticks need no specificationsReichenbach, Christoph2021 IEEE/ACM 43rd International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER), 2021, p.61-65Piscataway, NJ, USA: IEEE PressTexto completo disponível |
19 |
Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |
20 |
Material Type: Ata de Congresso
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Automatic Solution Summarization for Crash BugsWang, Haoye ; Xia, Xin ; Lo, David ; Grundy, John ; Wang, Xinyu2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1286-1297IEEETexto completo disponível |