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Refinado por: Nome da Publicação: Ieee Transactions On Reliability remover
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The Performance Analysis of Time Series Data Augmentation Technology for Small Sample Communication Device Recognition
The Performance Analysis of Time Series Data Augmentation Technology for Small Sample Communication Device Recognition
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The Performance Analysis of Time Series Data Augmentation Technology for Small Sample Communication Device Recognition

Cai, Zhuoran ; Ma, Wenxuan ; Wang, Xinrui ; Wang, Hanhong ; Feng, Zhongming

IEEE transactions on reliability, 2023-06, Vol.72 (2), p.574-585 [Periódico revisado por pares]

New York: IEEE

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12
Multivariate Phase Space Warping-Based Degradation Tracking and Remaining Useful Life Prediction of Rolling Bearings
Multivariate Phase Space Warping-Based Degradation Tracking and Remaining Useful Life Prediction of Rolling Bearings
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Multivariate Phase Space Warping-Based Degradation Tracking and Remaining Useful Life Prediction of Rolling Bearings

Liu, Hengyu ; Yuan, Rui ; Lv, Yong ; Yang, Xingkai ; Li, Hewenxuan ; Gedikli, Ersegun Deniz

IEEE transactions on reliability, 2024, p.1-14 [Periódico revisado por pares]

IEEE

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13
Epistemic Uncertainty Propagation and Reliability Evaluation of Feedback Control System
Epistemic Uncertainty Propagation and Reliability Evaluation of Feedback Control System
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Epistemic Uncertainty Propagation and Reliability Evaluation of Feedback Control System

Chen, Ying ; Wang, Yanfang ; Kang, Rui

IEEE transactions on reliability, 2024-03, Vol.73 (1), p.1-15 [Periódico revisado por pares]

New York: IEEE

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14
Parallel Batch Processing Machine Scheduling Under Two-Dimensional Bin-Packing Constraints
Parallel Batch Processing Machine Scheduling Under Two-Dimensional Bin-Packing Constraints
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Parallel Batch Processing Machine Scheduling Under Two-Dimensional Bin-Packing Constraints

Zhang, Xiaopan ; Shan, Mengjie ; Zeng, Ju

IEEE transactions on reliability, 2023-09, Vol.72 (3), p.1-11 [Periódico revisado por pares]

New York: IEEE

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15
A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability
A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability
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A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability

Zheng, Jian-Fei ; Si, Xiao-Sheng ; Hu, Chang-Hua ; Zhang, Zheng-Xin ; Jiang, Wei

IEEE transactions on reliability, 2016-06, Vol.65 (2), p.736-750 [Periódico revisado por pares]

New York: IEEE

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16
Digger: A Graph Contraction Algorithm for Patrolling Games
Digger: A Graph Contraction Algorithm for Patrolling Games
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Digger: A Graph Contraction Algorithm for Patrolling Games

Han, Jinpeng ; Wang, Zhen ; Chen, Xiaoguang ; Yang, Manzhi ; Wang, Fei-Yue

IEEE transactions on reliability, 2024-06, Vol.73 (2), p.1104-1116 [Periódico revisado por pares]

New York: IEEE

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17
Reliable Scheduling Algorithm for Space Debris Monitoring Resources Using Adaptive Multipopulation Differential Evolutionary Optimization With Reinforcement Learning
Reliable Scheduling Algorithm for Space Debris Monitoring Resources Using Adaptive Multipopulation Differential Evolutionary Optimization With Reinforcement Learning
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Reliable Scheduling Algorithm for Space Debris Monitoring Resources Using Adaptive Multipopulation Differential Evolutionary Optimization With Reinforcement Learning

Zhao, Man ; Li, Guoyang ; Li, Hui ; Li, Shenglong

IEEE transactions on reliability, 2022-06, Vol.71 (2), p.687-697 [Periódico revisado por pares]

New York: IEEE

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18
The Reliability of IoT Networks With Characteristics of Abnormal Induced Signals
The Reliability of IoT Networks With Characteristics of Abnormal Induced Signals
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The Reliability of IoT Networks With Characteristics of Abnormal Induced Signals

Kang, Wanjie ; Pan, Youshun ; Srivastava, Gautam

IEEE transactions on reliability, 2021-06, Vol.70 (2), p.808-818 [Periódico revisado por pares]

New York: IEEE

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19
Belief Availability for Repairable Systems Based on Uncertain Alternating Renewal Process
Belief Availability for Repairable Systems Based on Uncertain Alternating Renewal Process
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Belief Availability for Repairable Systems Based on Uncertain Alternating Renewal Process

Yu, Wang ; Linhan, Guo ; Meilin, Wen ; Rui, Kang

IEEE transactions on reliability, 2021-09, Vol.70 (3), p.1242-1254 [Periódico revisado por pares]

New York: IEEE

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20
TreeMerge: Efficient Generation of Minimal Hitting-Sets for Conflict Sets in Tree Structure for Model-Based Fault Diagnosis
TreeMerge: Efficient Generation of Minimal Hitting-Sets for Conflict Sets in Tree Structure for Model-Based Fault Diagnosis
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TreeMerge: Efficient Generation of Minimal Hitting-Sets for Conflict Sets in Tree Structure for Model-Based Fault Diagnosis

Zhao, Xiangfu ; Tong, Xiangrong ; Ouyang, Dantong ; Zhang, Liming ; Hou, Yanzhi

IEEE transactions on reliability, 2021-12, Vol.70 (4), p.1596-1610 [Periódico revisado por pares]

New York: IEEE

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