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Interfacial thin films rupture and self-similarity
Interfacial thin films rupture and self-similarity
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Interfacial thin films rupture and self-similarity

Ward, Margaret H.

Physics of fluids (1994), 2011-06, Vol.23 (6), p.062105-062105-14 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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12
Smooth full field reconstruction of velocity and its gradients from noisy scattered velocimetry data in a cross-slot flow
Smooth full field reconstruction of velocity and its gradients from noisy scattered velocimetry data in a cross-slot flow
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Smooth full field reconstruction of velocity and its gradients from noisy scattered velocimetry data in a cross-slot flow

Sadati, Monirosadat ; Luap, Clarisse ; Kröger, Martin ; Gusev, Andrei A. ; Öttinger, Hans Christian

Journal of rheology (New York : 1978), 2011-03, Vol.55 (2), p.353-377 [Periódico revisado por pares]

Melville, NY: Society of Rheology

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13
A mechanism of Marangoni instability in evaporating thin liquid films due to soluble surfactant
A mechanism of Marangoni instability in evaporating thin liquid films due to soluble surfactant
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A mechanism of Marangoni instability in evaporating thin liquid films due to soluble surfactant

Yiantsios, Stergios G. ; Higgins, Brian G.

Physics of fluids (1994), 2010-02, Vol.22 (2) [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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14
Global well posedness and limit behavior of the solutions to the viscous Degasperis–Procesi equation
Global well posedness and limit behavior of the solutions to the viscous Degasperis–Procesi equation
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Global well posedness and limit behavior of the solutions to the viscous Degasperis–Procesi equation

Tian, Lixin ; Liang, Shujuan

Journal of mathematical physics, 2009-03, Vol.50 (3), p.033503-033503-16 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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15
Instabilities and Taylor dispersion in isothermal binary thin fluid films
Instabilities and Taylor dispersion in isothermal binary thin fluid films
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Instabilities and Taylor dispersion in isothermal binary thin fluid films

Borden, Z. ; Grandjean, H. ; Hosoi, A. E. ; Kondic, L. ; Tilley, B. S.

Physics of fluids (1994), 2008-10, Vol.20 (10), p.102103-102103-11 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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16
Analysis and control of cavity flow
Analysis and control of cavity flow
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Analysis and control of cavity flow

Kourta, A. ; Vitale, E.

Physics of fluids (1994), 2008-07, Vol.20 (7), p.077104-077104-10 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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17
Dissipation and enstrophy in isotropic turbulence: Resolution effects and scaling in direct numerical simulations
Dissipation and enstrophy in isotropic turbulence: Resolution effects and scaling in direct numerical simulations
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Dissipation and enstrophy in isotropic turbulence: Resolution effects and scaling in direct numerical simulations

Donzis, D. A. ; Yeung, P. K. ; Sreenivasan, K. R.

Physics of fluids (1994), 2008-04, Vol.20 (4) [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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18
A thin conducting viscous film on an inclined plane in the presence of a uniform normal electric field: Bifurcation scenarios
A thin conducting viscous film on an inclined plane in the presence of a uniform normal electric field: Bifurcation scenarios
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A thin conducting viscous film on an inclined plane in the presence of a uniform normal electric field: Bifurcation scenarios

Uma, B. ; Usha, R.

Physics of fluids (1994), 2008-03, Vol.20 (3) [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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19
Dynamics of a horizontal thin liquid film in the presence of reactive surfactants
Dynamics of a horizontal thin liquid film in the presence of reactive surfactants
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Dynamics of a horizontal thin liquid film in the presence of reactive surfactants

Pereira, A. ; Trevelyan, P. M. J. ; Thiele, U. ; Kalliadasis, S.

Physics of fluids (1994), 2007-11, Vol.19 (11) [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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20
Linear stability of a two-layer film flow down an inclined channel: A second-order weighted residual approach
Linear stability of a two-layer film flow down an inclined channel: A second-order weighted residual approach
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Linear stability of a two-layer film flow down an inclined channel: A second-order weighted residual approach

Amaouche, M. ; Mehidi, N. ; Amatousse, N.

Physics of fluids (1994), 2007-08, Vol.19 (8), p.084106-084106-14 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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