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A comparative study on detection of bartonella henselae infection by culture followed by pcr, nested-pcr and ifa
A comparative study on detection of bartonella henselae infection by culture followed by pcr, nested-pcr and ifa
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A comparative study on detection of bartonella henselae infection by culture followed by pcr, nested-pcr and ifa

DIREN SIGIRCI B ; CELIK B ; BASARAN KAHRAMAN B ; GUMUS B ; METINER K ; ADIGUZEL MC ; IKIZ S ; BAGCIGIL AF ; OZGUR NY ; AK S

Veteriner fakultesi dergisi, 2017-03, Vol.23 (2), p.333-337 [Periódico revisado por pares]

Kafkas University, Faculty of Veterinary Medicine

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2
A computational damage mechanics model for thermomigration
A computational damage mechanics model for thermomigration
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A computational damage mechanics model for thermomigration

Li, Shidong ; Basaran, Cemal

Mechanics of materials, 2009-03, Vol.41 (3), p.271-278 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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3
Advancing electronic packaging, one solder joint at a time
Advancing electronic packaging, one solder joint at a time
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Advancing electronic packaging, one solder joint at a time

R & D, 2003-10, Vol.45 (10), p.10

Cleveland: Advantage Business Media

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4
An accelerated algorithm for full band electron–phonon scattering rate computation
An accelerated algorithm for full band electron–phonon scattering rate computation
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An accelerated algorithm for full band electron–phonon scattering rate computation

Chu, Yanbiao ; Gautreau, Pierre ; Ragab, Tarek ; Basaran, Cemal

Computer physics communications, 2014-12, Vol.185 (12), p.3392-3397 [Periódico revisado por pares]

Elsevier B.V

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5
An analytical model for thermal stress analysis of multi-layered microelectronic packaging
An analytical model for thermal stress analysis of multi-layered microelectronic packaging
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An analytical model for thermal stress analysis of multi-layered microelectronic packaging

Wen, Yujun ; Basaran, Cemal

Mechanics of materials, 2004-04, Vol.36 (4), p.369-385 [Periódico revisado por pares]

Lausanne: Elsevier Ltd

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6
Analysis of multi-layered microelectronic packaging under uniformly distributed loading
Analysis of multi-layered microelectronic packaging under uniformly distributed loading
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Analysis of multi-layered microelectronic packaging under uniformly distributed loading

Wen, Yujun ; Basaran, Cemal

International journal of solids and structures, 2003-06, Vol.40 (13), p.3331-3345 [Periódico revisado por pares]

Oxford: Elsevier Ltd

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7
Analysis of Multilayered Microelectronic Packaging Under Thermal Gradient Loading
Analysis of Multilayered Microelectronic Packaging Under Thermal Gradient Loading
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Analysis of Multilayered Microelectronic Packaging Under Thermal Gradient Loading

Basaran, C. ; Wen, Y.

IEEE transactions on components and packaging technologies, 2006-12, Vol.29 (4), p.850-855 [Periódico revisado por pares]

New York: IEEE

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8
Anisotropy of Graphene Nanoflake Diamond Interface Frictional Properties
Anisotropy of Graphene Nanoflake Diamond Interface Frictional Properties
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Anisotropy of Graphene Nanoflake Diamond Interface Frictional Properties

Zhang, Ji ; Osloub, Ehsan ; Siddiqui, Fatima ; Zhang, Weixiang ; Ragab, Tarek ; Basaran, Cemal

Materials, 2019-05, Vol.12 (9), p.1425 [Periódico revisado por pares]

Switzerland: MDPI AG

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9
Application of MoirÉ Interferometry to Determine Strain Fields and Debonding of Solder Joints in BGA Packages
Application of MoirÉ Interferometry to Determine Strain Fields and Debonding of Solder Joints in BGA Packages
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Application of MoirÉ Interferometry to Determine Strain Fields and Debonding of Solder Joints in BGA Packages

Liu, Heng ; Basaran, C ; Cartwright, A N ; Casey, W

IEEE transactions on components and packaging technologies, 2004-03, Vol.27 (1), p.217-223 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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10
Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles
Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles
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Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles

Singh, Sumitra ; Rana, Santosh ; Prakash, Shashi ; Sasaki, Osami

Optik (Stuttgart), 2011-09, Vol.122 (18), p.1666-1671 [Periódico revisado por pares]

Elsevier GmbH

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