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Sample Eigenvalue Based Detection of High-Dimensional Signals in White Noise Using Relatively Few Samples
Sample Eigenvalue Based Detection of High-Dimensional Signals in White Noise Using Relatively Few Samples
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Sample Eigenvalue Based Detection of High-Dimensional Signals in White Noise Using Relatively Few Samples

Nadakuditi, R.R. ; Edelman, A.

IEEE transactions on signal processing, 2008-07, Vol.56 (7), p.2625-2638 [Periódico revisado por pares]

New York: IEEE

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Tunable Peeling Technique and Mechanism of Thin Chip From Compliant Adhesive Tapes
Tunable Peeling Technique and Mechanism of Thin Chip From Compliant Adhesive Tapes
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Tunable Peeling Technique and Mechanism of Thin Chip From Compliant Adhesive Tapes

Liu, Zunxu ; Huang, YongAn ; Chen, Jiankui ; Yin, Zhouping

IEEE transactions on components, packaging, and manufacturing technology (2011), 2014-04, Vol.4 (4), p.560-568 [Periódico revisado por pares]

Piscataway: IEEE

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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