Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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SIMS study on the surface chemistry of stainless steel AISI 304 cylindrical tensile test samples showing hydrogen embrittlementIzawa, C. ; Wagner, S. ; Martin, M. ; Weber, S. ; Bourgeon, A. ; Pargeter, R. ; Michler, T. ; Pundt, A.Journal of alloys and compounds, 2011-09, Vol.509, p.S885-S890 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
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2 |
Material Type: Artigo
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Severe accident research in the core degradation area: An example of effective international cooperation between the European Union (EU) and the Commonwealth of Independent States (CIS) by the International Science and Technology CenterBottomley, D. ; Stuckert, J. ; Hofmann, P. ; Tocheny, L. ; Hugon, M. ; Journeau, C. ; Clément, B. ; Weber, S. ; Guentay, S. ; Hozer, Z. ; Herranz, L. ; Schumm, A. ; Oriolo, F. ; Altstadt, E. ; Krause, M. ; Fischer, M. ; Khabensky, V.B. ; Bechta, S.V. ; Veshchunov, M.S. ; Palagin, A.V. ; Kiselev, A.E. ; Nalivaev, V.I. ; Goryachev, A.V. ; Zhdanov, V. ; Baklanov, V.Nuclear engineering and design, 2012-11, Vol.252, p.226-241 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Vacancy clusters created via room temperature irradiation in 6H-SiCSCHOLLE, A ; GREULICH-WEBER, S ; RAULS, E ; SCHMIDT, W. G ; GERSTMANN, UPhysica. B, Condensed matter, 2009, Vol.404 (23-24), p.4742-4744 [Periódico revisado por pares]Kidlington: ElsevierTexto completo disponível |
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4 |
Material Type: Artigo
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Efficacy and safety results from OCTAVIA, a single-arm phase II study evaluating front-line bevacizumab, carboplatin and weekly paclitaxel for ovarian cancerGonzalez-Martin, Antonio ; Gladieff, Laurence ; Tholander, Bengt ; Stroyakovsky, Daniel ; Gore, Martin ; Scambia, Giovanni ; Kovalenko, Nadezhda ; Oaknin, Ana ; Ronco, Julian Perez ; Freudensprung, Ulrich ; Pignata, SandroEuropean journal of cancer (1990), 2013-12, Vol.49 (18), p.3831-3838 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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5 |
Material Type: Artigo
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Electron paramagnetic resonance of the scandium acceptor in 6H and 4H silicon carbideMÄRZ, M ; GREULICH-WEBER, S ; SPAETH, J.-M ; MOKHOV, E. N ; KALABUKHOVA, E. NSemiconductor science and technology, 2000, Vol.15 (1), p.55-60 [Periódico revisado por pares]Bristol: Institute of PhysicsTexto completo disponível |
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6 |
Material Type: Artigo
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Earth system models of intermediate complexity: closing the gap in the spectrum of climate system modelsCLAUSSEN, M ; MYSAK, L. A ; CALOV, R ; GANOPOLSKI, A ; GOOSSE, H ; LOHMANN, G ; LUNKEIT, F ; MOKHOV, I. I ; PETOUKHOV, V ; STONE, P ; WANG, Z ; WEAVER, A. J ; CRUCIFIX, M ; FICHEFET, T ; LOUTRE, M.-F ; WEBER, S. L ; ALCAMO, J ; ALEXEEV, V. A ; BERGER, AClimate dynamics, 2002, Vol.18 (7), p.579-586 [Periódico revisado por pares]Berlin: SpringerTexto completo disponível |
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7 |
Material Type: Artigo
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Self-Control as a Criminogenic Need: A Longitudinal Test of Social Intervention to Improve Self-ControlMorris, R. C.Aktualʹnye problemy ėkonomiki i prava, 2020-09, Vol.14 (3)Texto completo disponível |
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8 |
Material Type: Ata de Congresso
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SAW resonator filters for communications systemsSinitsyna, T.V. ; Praporchtshikov, V.V. ; Bagdasarian, A.S.2004 14th International Crimean Conference "Microwave and Telecommunication Technology" (IEEE Cat. No.04EX843), 2004, p.472-473IEEETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Static characteristics of crossed quantum wiresObukhov, I.A. ; Kvjatkevich, I.I. ; Lavrenchuk, A.A. ; Rumjancev, S.V.2004 14th International Crimean Conference "Microwave and Telecommunication Technology" (IEEE Cat. No.04EX843), 2004, p.507-511IEEETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Optimizing relativistic TWT-Os built around irregular waveguides with regard to higher modesBatura, M.P. ; Kurayev, A.A. ; Sinitsyn, A.K.2004 14th International Crimean Conference "Microwave and Telecommunication Technology" (IEEE Cat. No.04EX843), 2004, p.175-179IEEETexto completo disponível |