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11 |
Material Type: Artículo
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Surface passivation at low temperature of p- and n-type silicon wafers using a double layer a-Si:H/SiNx:HFocsa, A. ; Slaoui, A. ; Charifi, H. ; Stoquert, J.P. ; Roques, S.Materials science & engineering. B, Solid-state materials for advanced technology, 2009-03, Vol.159, p.242-247 [Revista revisada por pares]Elsevier B.VTexto completo disponible |
12 |
Material Type: Artículo
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CW laser induced crystallization of thin amorphous silicon films deposited by EBE and PECVDSaid-Bacar, Z. ; Prathap, P. ; Cayron, C. ; Mermet, F. ; Leroy, Y. ; Antoni, F. ; Slaoui, A. ; Fogarassy, E.Applied surface science, 2012-09, Vol.258 (23), p.9359-9365 [Revista revisada por pares]Amsterdam: Elsevier B.VTexto completo disponible |
13 |
Material Type: Artículo
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Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealingSAHIN, D ; YILDIZ, I ; GENCER, A. I ; AYGUN, G ; SLAOUI, A ; TURAN, RThin solid films, 2010-02, Vol.518 (9), p.2365-2369 [Revista revisada por pares]Amsterdam: ElsevierTexto completo disponible |
14 |
Material Type: Artículo
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Light emitting mechanisms dependent on stoichiometry of Si-rich-SiNx films grown by PECVDTorchynska, T. V. ; Casas Espinola, J. L. ; Jaramillo Gomez, J. A. ; Bentosa Gutiérrez, J. A. ; Khomenkova, L. ; Slaoui, A.Journal of materials science. Materials in electronics, 2017-05, Vol.28 (10), p.6977-6981 [Revista revisada por pares]New York: Springer USTexto completo disponible |
15 |
Material Type: Artículo
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Ge nanocrystals in HfO2/SiN dielectric stacks by low energy ion beam synthesisCarrada, M. ; Sahu, B.S. ; Bonafos, C. ; Gloux, F. ; Groenen, J. ; Muller, D. ; Slaoui, A.Thin solid films, 2013-09, Vol.543, p.94-99 [Revista revisada por pares]Amsterdam: Elsevier B.VTexto completo disponible |
16 |
Material Type: Artículo
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Defect annealing processes for polycrystalline silicon thin-film solar cellsSteffens, S. ; Becker, C. ; Zollondz, J.-H. ; Chowdhury, A. ; Slaoui, A. ; Lindekugel, S. ; Schubert, U. ; Evans, R. ; Rech, B.Materials science & engineering. B, Solid-state materials for advanced technology, 2013-05, Vol.178 (9), p.670-675 [Revista revisada por pares]Elsevier B.VTexto completo disponible |
17 |
Material Type: Artículo
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Crystallographic analysis of polysilicon films formed on foreign substrates by aluminium induced crystallisation and epitaxyPihan, E. ; Focsa, A. ; Slaoui, A. ; Maurice, C.Thin solid films, 2006-07, Vol.511 (Complete), p.15-20 [Revista revisada por pares]Elsevier B.VTexto completo disponible |
18 |
Material Type: Artículo
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EBSD analysis of polysilicon films formed by aluminium induced crystallization of amorphous siliconTüzün, Ö. ; Auger, J.M. ; Gordon, I. ; Focsa, A. ; Montgomery, P.C. ; Maurice, C. ; Slaoui, A. ; Beaucarne, G. ; Poortmans, J.Thin solid films, 2008-08, Vol.516 (20), p.6882-6887 [Revista revisada por pares]Lausanne: Elsevier B.VTexto completo disponible |
19 |
Material Type: Artículo
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Polycrystalline silicon films by aluminium-induced crystallisation: growth process vs. silicon deposition methodPihan, E. ; Slaoui, A. ; Roca i Cabarrocas, P. ; Focsa, A.Thin solid films, 2004-03, Vol.451 (Complete), p.328-333 [Revista revisada por pares]Elsevier B.VTexto completo disponible |
20 |
Material Type: Artículo
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Poly-Si films prepared by rapid thermal CVD on boron and phosphorus silicate glass coated ceramic substratesFocsa, A. ; Slaoui, A. ; Pihan, E. ; Snijkers, F. ; Leempoel, P. ; Beaucarne, G. ; Poortmans, J.Thin solid films, 2006-07, Vol.511 (Complete), p.404-410 [Revista revisada por pares]Elsevier B.VTexto completo disponible |