Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Recent Progress of Radiography and Tomography at the Energy-resolved Neutron Imaging System RADENMatsumoto, Y. ; Segawa, M. ; Kai, T. ; Shinohara, T. ; Nakatani, T. ; Oikawa, K. ; Hiroi, K. ; Su, Y.H. ; Hayashida, H. ; Parker, J.D. ; Zhang, S.Y. ; Kiyanagi, Y.Physics procedia, 2017, Vol.88, p.162-166Elsevier B.VSem texto completo |
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2 |
Material Type: Artigo
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Evaluation of nuclide density by neutron resonance transmission at the NOBORU instrument in J-PARC/MLFHasemi, H. ; Harada, M. ; Kai, T. ; Shinohara, T. ; Ooi, M. ; Sato, H. ; Kino, K. ; Segawa, M. ; Kamiyama, T. ; Kiyanagi, Y.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2015-02, Vol.773, p.137-149 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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3 |
Material Type: Artigo
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Present Status of Research on Pulsed Neutron Imaging in JapanKiyanagi, Y. ; Shinohara, T. ; Kai, T. ; Kamiyama, T. ; Sato, H. ; Kino, K. ; Aizawa, K. ; Arai, M. ; Harada, M. ; Sakai, K. ; Oikawa, K. ; Ooi, M. ; Maekawa, F. ; Iikura, H. ; Sakai, T. ; Matsubayashi, M. ; Segawa, M. ; Kureta, M.Physics procedia, 2013, Vol.43, p.92-99Elsevier B.VSem texto completo |
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4 |
Material Type: Artigo
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Design study of the imaging beam line at J-PARC MLF, ERNISKiyanagi, Y. ; Kamiyama, T. ; Sato, H. ; Shinohara, T. ; Kai, T. ; Aizawa, K. ; Arai, M. ; Harada, M. ; Sakai, K. ; Oikawa, K. ; Ohi, M. ; Maekawa, F. ; Sakai, T. ; Matsubayashi, M. ; Segawa, M. ; Kureta, M.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-09, Vol.651 (1), p.16-20 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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5 |
Material Type: Artigo
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A facility for measurements of (n,γ) cross-sections of a nucleus in the range 0.008≤ E n<20 MeVSegawa, M. ; Toh, Y. ; Harada, H. ; Kitatani, F. ; Koizumi, M. ; Hatsukawa, Y. ; Fukahori, T. ; Matsue, H. ; Oshima, M. ; Tanimura, Y. ; Tsutsumi, M. ; Nagai, Y.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2010-06, Vol.618 (1), p.153-159 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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6 |
Material Type: Artigo
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Anisotropy of magnetization-induced surface optical second harmonic generation from Co doped rutile TiO2WATANABE, R ; TAMURA, M ; YAHATA, Y ; MIZUTANI, G ; SUZUKI, T ; SEGAWA, Y ; MATSUMOTO, Y ; YAMAMOTO, Y ; KOINUMA, HApplied surface science, 2009-11, Vol.256 (4), p.1092-1095 [Periódico revisado por pares]Amsterdam: ElsevierTexto completo disponível |
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7 |
Material Type: Artigo
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Development of three-dimensional prompt γ-ray analysis systemSegawa, M. ; Matsue, H. ; Kureta, M.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-06, Vol.605 (1), p.54-56 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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8 |
Material Type: Artigo
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Development of multi-pinhole collimator for large imaging area with high spatial resolutionHayashida, H. ; Segawa, M. ; Yasuda, R. ; Iikura, H. ; Sakai, T. ; Matsubayashi, M.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-06, Vol.605 (1), p.77-80 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Effects of particle sizes and dispersion media on micromolding of colloidal silica particles underneath top-gathering pillar patternsSegawa, Hiroyo ; Tachiki, Shigeru ; Yano, Tetsuji ; Shibata, ShuichiMaterials science & engineering. B, Solid-state materials for advanced technology, 2009-04, Vol.161 (1), p.85-90 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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10 |
Material Type: Artigo
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Changes in effective work function of HfxRu1-x alloy gate electrodeNABATAME, T ; NUNOSHIGE, Y ; KADOSHIMA, M ; TAKABA, H ; SEGAWA, K ; KIMURA, S ; SATAKE, H ; OTA, H ; OHISHI, T ; TORIUMI, AMicroelectronic engineering, 2008-07, Vol.85 (7), p.1524-1528 [Periódico revisado por pares]Amsterdam: Elsevier ScienceTexto completo disponível |