Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Ata de Congresso
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Early Experience with Scientific Programs on the Cray MTA-2Anderson, Wendell ; Briggs, Preston ; Hellberg, C. Stephen ; Hess, Daryl W. ; Khokhlov, Alexei ; Lanzagorta, Marco ; Rosenberg, RobertACM/IEEE SC 2003 Conference (SC'03), 2003, p.46-46New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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FlightTracker: A Novel Optical/Inertial Tracker for Cockpit Enhanced VisionFoxlin, Eric ; Altshuler, Yury ; Naimark, Leonid ; Harrington, MikeProceedings of the 3rd IEEE/ACM International Symposium on Mixed and Augmented Reality, 2004, p.212-221Washington, DC, USA: IEEE Computer SocietyTexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Exact Logic Synthesis for Reversible Quantum-Flux-Parametron LogicFu, Rongliang ; Chen, Olivia ; Yoshikawa, Nobuyuki ; Ho, Tsung-Yi2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2023, p.1-9IEEESem texto completo |
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4 |
Material Type: Ata de Congresso
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DLPlace: A Delay-Line Clocking-Based Placement Framework for AQFP CircuitsFu, Rongliang ; Chen, Olivia ; Yu, Bei ; Yoshikawa, Nobuyuki ; Ho, Tsung-Yi2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2023, p.1-8IEEESem texto completo |
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Material Type: Ata de Congresso
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Invited: Accelerating Genome Analysis via Algorithm-Architecture Co-DesignMutlu, Onur ; Firtina, Can2023 60th ACM/IEEE Design Automation Conference (DAC), 2023, p.1-4IEEESem texto completo |
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6 |
Material Type: Ata de Congresso
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Superconducting computing with alternating logic elementsTzimpragos, Georgios ; Volk, Jennifer ; Wynn, Alex ; Smith, James E. ; Sherwood, Timothy2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA), 2021, p.651-664Piscataway, NJ, USA: IEEE PressSem texto completo |
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7 |
Material Type: Ata de Congresso
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Mapping template semantics to SMVYun Lu ; Atlee, J.M. ; Day, N.A. ; Niu, J.Automated Software Engineering: Proceedings of the 19th IEEE international conference on Automated software engineering; 20-24 Sept. 2004, 2004, p.320-325IEEETexto completo disponível |