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1
Finite-Element Formulations for Systems With High-Temperature Superconductors
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Finite-Element Formulations for Systems With High-Temperature Superconductors

Dular, Julien ; Geuzaine, Christophe ; Vanderheyden, Benoit

IEEE transactions on applied superconductivity, 2020-04, Vol.30 (3), p.1-13 [Periódico revisado por pares]

New York: IEEE

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2
A Variable-Capacitance Energy Harvester With Miniaturized Inductor Targeting Implantable Devices
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A Variable-Capacitance Energy Harvester With Miniaturized Inductor Targeting Implantable Devices

Daneshvar, Seyed Hossein ; Maymandi-Nejad, Mohammad ; Yuce, Mehmet Rasit ; Redoute, Jean-Michel

IEEE transactions on industrial electronics (1982), 2022-01, Vol.69 (1), p.475-484 [Periódico revisado por pares]

New York: IEEE

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3
2-D Eddy Current Boundary Value Problems for Power Cables With Helicoidal Symmetry
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2-D Eddy Current Boundary Value Problems for Power Cables With Helicoidal Symmetry

Piwonski, Albert ; Dular, Julien ; Rezende, Rodrigo Silva ; Schuhmann, Rolf

IEEE transactions on magnetics, 2023-05, Vol.59 (5), p.1-4 [Periódico revisado por pares]

New York: IEEE

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4
Optimization of the Power Flow Generated by an AC Energy Harvester for Variable Operating Conditions
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Optimization of the Power Flow Generated by an AC Energy Harvester for Variable Operating Conditions

Laurent, Philippe ; Fagnard, Jean-Francois ; Dupont, Francois ; Redoute, Jean-Michel

IEEE transactions on circuits and systems. I, Regular papers, 2022-06, Vol.69 (6), p.2625-2636 [Periódico revisado por pares]

New York: IEEE

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5
Optimal Voltage-Support Control for Distributed Generation Inverters in RL Grid-Faulty Networks
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Optimal Voltage-Support Control for Distributed Generation Inverters in RL Grid-Faulty Networks

Garnica, Miguel ; de Vicuna, Luis Garcia ; Miret, Jaume ; Castilla, Miguel ; Guzman, Ramon

IEEE transactions on industrial electronics (1982), 2020-10, Vol.67 (10), p.8405-8415 [Periódico revisado por pares]

New York: IEEE

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6
On the Stability of Mixed Finite-Element Formulations for High-Temperature Superconductors
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On the Stability of Mixed Finite-Element Formulations for High-Temperature Superconductors

Dular, Julien ; Harutyunyan, Mane ; Bortot, Lorenzo ; Schops, Sebastian ; Vanderheyden, Benoit ; Geuzaine, Christophe

IEEE transactions on applied superconductivity, 2021-09, Vol.31 (6), p.1-12 [Periódico revisado por pares]

New York: IEEE

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7
A Comparative Study of Output Metrics for an MEMS Resonant Sensor Consisting of Three Weakly Coupled Resonators
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A Comparative Study of Output Metrics for an MEMS Resonant Sensor Consisting of Three Weakly Coupled Resonators

Chun Zhao ; Wood, Graham S. ; Jianbing Xie ; Honglong Chang ; Suan Hui Pu ; Kraft, Michael

Journal of microelectromechanical systems, 2016-08, Vol.25 (4), p.626-636 [Periódico revisado por pares]

New York: IEEE

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8
A Wireless Low-power Single-unit Wearable System for Continuous Early Warning Score Calculation
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A Wireless Low-power Single-unit Wearable System for Continuous Early Warning Score Calculation

Bellier, P. ; Coppieters 't Wallant, D. ; Van den Bongarth, H. ; Bijnens, W. ; Aarts, J. ; Vandenryt, T. ; Thoelen, R. ; Duflot, P. ; Dupont, F. ; Redoute, J.-M.

IEEE sensors journal, 2023-06, Vol.23 (11), p.1-1 [Periódico revisado por pares]

New York: IEEE

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9
Wide-Area Detection of Voltage Instability From Synchronized Phasor Measurements. Part II: Simulation Results
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Wide-Area Detection of Voltage Instability From Synchronized Phasor Measurements. Part II: Simulation Results

Glavic, M. ; Van Cutsem, T.

IEEE transactions on power systems, 2009-08, Vol.24 (3), p.1417-1425 [Periódico revisado por pares]

New York: IEEE

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10
Determination of Partial Discharge Inception Voltage and Location of Partial Discharges by Means of Paschen's Theory and FEM
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Determination of Partial Discharge Inception Voltage and Location of Partial Discharges by Means of Paschen's Theory and FEM

Parent, Guillaume ; Rossi, Mathieu ; Duchesne, Stephane ; Dular, Patrick

IEEE transactions on magnetics, 2019-06, Vol.55 (6), p.1-4 [Periódico revisado por pares]

New York: IEEE

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