Resultados de 1 a 10 de 23 para Busca Geral
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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Ata de Congresso
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Use of exposure compensation to improve device performance for speed and binning based on electrical parametric feedback into fabrication designAckmann, Paul W ; Brown, Stuart E ; Edwards, Richard D ; Downey, Doug ; Michael, Mark ; Turnquest, Karen L ; Nistler, John LSPIE 1997Texto completo disponível |
| 2 |
Material Type: Artigo
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A Hierarchical Discriminant Analysis for Species Identification in Raw Meat by Visible and near Infrared SpectroscopyArnalds, Thorsteinn ; McElhinney, John ; Fearn, Tom ; Downey, GerardJournal of near infrared spectroscopy (United Kingdom), 2004-06, Vol.12 (3), p.183-188 [Periódico revisado por pares]London, England: SAGE PublicationsTexto completo disponível |
| 3 |
Material Type: Artigo
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Low Temperature Shallow Junction Formation For 70nm Technology Node And BeyondBorland, John O.MRS proceedings, 2002, Vol.717, Article C1.1New York, USA: Cambridge University PressSem texto completo |
| 4 |
Material Type: Artigo
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Silicon carbide UV photodiodesBrown, D.M. ; Downey, E.T. ; Ghezzo, M. ; Kretchmer, J.W. ; Saia, R.J. ; Liu, Y.S. ; Edmond, J.A. ; Gati, G. ; Pimbley, J.M. ; Schneider, W.E.IEEE transactions on electron devices, 1993-02, Vol.40 (2), p.325-333 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
| 5 |
Material Type: Artigo
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SiC MOS interface characteristicsBrown, D.M. ; Ghezzo, M. ; Kretchmer, J. ; Downey, E. ; Pimbley, J. ; Palmour, J.IEEE transactions on electron devices, 1994-04, Vol.41 (4), p.618-620 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
| 6 |
Material Type: Artigo
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Probabilistic bounds on the performance of list schedulingBRUNO, J. L ; DOWNEY, P. JSIAM journal on computing, 1986-05, Vol.15 (2), p.409-417 [Periódico revisado por pares]Philadelphia, PA: Society for Industrial and Applied MathematicsTexto completo disponível |
| 7 |
Material Type: Artigo
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Complexity of Task Sequencing with Deadlines, Set-Up Times and Changeover CostsBruno, John ; Downey, PeterSIAM journal on computing, 1978-11, Vol.7 (4), p.393-404 [Periódico revisado por pares]Philadelphia: Society for Industrial and Applied MathematicsTexto completo disponível |
| 8 |
Material Type: Artigo
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PCAM: a multi-user facility-based protein crystallization apparatus for microgravityCarter, Daniel C. ; Wright, Brenda ; Miller, Teresa ; Chapman, Jenny ; Twigg, Pam ; Keeling, Kim ; Moody, Kerry ; White, Melissa ; Click, James ; Ruble, John R. ; Ho, Joseph X. ; Adcock-Downey, Lawana ; Dowling, Tim ; Chang, Chong-Hwan ; Ala, Paul ; Rose, John ; Wang, B.C. ; Declercq, Jean-Paul ; Evrard, Christine ; Rosenberg, John ; Wery, Jean-Pierre ; Clawson, David ; Wardell, Mark ; Stallings, W. ; Stevens, A.Journal of crystal growth, 1999-01, Vol.196 (2), p.610-622 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
| 9 |
Material Type: Artigo
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Diffusion-controlled crystallization apparatus for microgravity (DCAM): flight and ground-based applicationsCarter, Daniel C. ; Wright, Brenda ; Miller, Teresa ; Chapman, Jenny ; Twigg, Pam ; Keeling, Kim ; Moody, Kerry ; White, Melissa ; James Click ; Ruble, John R. ; Ho, Joseph X. ; Adcock-Downey, Lawana ; Bunick, Gerard ; Harp, JoelJournal of crystal growth, 1999-01, Vol.196 (2), p.602-609 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
| 10 |
Material Type: Artigo
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Picosecond dynamics of a gain-switched InGaAsP laserDowney, P. ; Bowers, J. ; Tucker, R. ; Agyekum, E.IEEE J. Quant. Electron.; (United States), 1987-06, Vol.23 (6), p.1039-1047 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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