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1
Silicon carbide UV photodiodes
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Artigo
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Silicon carbide UV photodiodes

Brown, D.M. ; Downey, E.T. ; Ghezzo, M. ; Kretchmer, J.W. ; Saia, R.J. ; Liu, Y.S. ; Edmond, J.A. ; Gati, G. ; Pimbley, J.M. ; Schneider, W.E.

IEEE transactions on electron devices, 1993-02, Vol.40 (2), p.325-333 [Periódico revisado por pares]

New York, NY: IEEE

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2
SiC MOS interface characteristics
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SiC MOS interface characteristics

Brown, D.M. ; Ghezzo, M. ; Kretchmer, J. ; Downey, E. ; Pimbley, J. ; Palmour, J.

IEEE transactions on electron devices, 1994-04, Vol.41 (4), p.618-620 [Periódico revisado por pares]

New York, NY: IEEE

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3
PCAM: a multi-user facility-based protein crystallization apparatus for microgravity
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PCAM: a multi-user facility-based protein crystallization apparatus for microgravity

Carter, Daniel C. ; Wright, Brenda ; Miller, Teresa ; Chapman, Jenny ; Twigg, Pam ; Keeling, Kim ; Moody, Kerry ; White, Melissa ; Click, James ; Ruble, John R. ; Ho, Joseph X. ; Adcock-Downey, Lawana ; Dowling, Tim ; Chang, Chong-Hwan ; Ala, Paul ; Rose, John ; Wang, B.C. ; Declercq, Jean-Paul ; Evrard, Christine ; Rosenberg, John ; Wery, Jean-Pierre ; Clawson, David ; Wardell, Mark ; Stallings, W. ; Stevens, A.

Journal of crystal growth, 1999-01, Vol.196 (2), p.610-622 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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4
Diffusion-controlled crystallization apparatus for microgravity (DCAM): flight and ground-based applications
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Diffusion-controlled crystallization apparatus for microgravity (DCAM): flight and ground-based applications

Carter, Daniel C. ; Wright, Brenda ; Miller, Teresa ; Chapman, Jenny ; Twigg, Pam ; Keeling, Kim ; Moody, Kerry ; White, Melissa ; James Click ; Ruble, John R. ; Ho, Joseph X. ; Adcock-Downey, Lawana ; Bunick, Gerard ; Harp, Joel

Journal of crystal growth, 1999-01, Vol.196 (2), p.602-609 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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5
Nodes, Links, and Phase Transitions: Popularizing "Network Science"
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Nodes, Links, and Phase Transitions: Popularizing "Network Science"

Downey, Greg

Technology and Culture, 2004-01, Vol.45 (1), p.162-167 [Periódico revisado por pares]

Baltimore: Johns Hopkins University Press

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6
Picosecond dynamics of a gain-switched InGaAsP laser
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Picosecond dynamics of a gain-switched InGaAsP laser

Downey, P. ; Bowers, J. ; Tucker, R. ; Agyekum, E.

IEEE J. Quant. Electron.; (United States), 1987-06, Vol.23 (6), p.1039-1047 [Periódico revisado por pares]

United States: IEEE

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7
Anisotropy and Lorentz-force dependence of twin-boundary pinning and its effect on flux-lattice melting in single-crystal YBa2Cu3O7-δ
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Anisotropy and Lorentz-force dependence of twin-boundary pinning and its effect on flux-lattice melting in single-crystal YBa2Cu3O7-δ

FLESHLER, S ; WAI-KWONG KWOK ; WELP, U ; VINOKUR, V. M ; SMITH, M. K ; DOWNEY, J ; CRABTREE, G. W

Physical review. B, Condensed matter, 1993-06, Vol.47 (21), p.14448-14461

Woodbury, NY: American Physical Society

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8
Optimization of a Weld Overlay on a Plate Structure
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Optimization of a Weld Overlay on a Plate Structure

Goldak, John ; Asadi, Mahyar ; Zhou, Jianguo ; Tchernov, Stanislav ; Downey, Dan

Journal of pressure vessel technology, 2010-02, Vol.132 (1) [Periódico revisado por pares]

New York, NY: ASME

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9
Nanostructured Thermoelectric Materials and High-Efficiency Power-Generation Modules
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Nanostructured Thermoelectric Materials and High-Efficiency Power-Generation Modules

Hogan, Timothy P. ; Downey, Adam ; Short, Jarrod ; D’Angelo, Jonathan ; Wu, Chun-I ; Quarez, Eric ; Androulakis, John ; Poudeu, Pierre F.P. ; Sootsman, Joseph R. ; Chung, Duck-Young ; Kanatzidis, Mercouri G. ; Mahanti, S.D. ; Timm, Edward J. ; Schock, Harold ; Ren, Fei ; Johnson, Jason ; Case, Eldon D.

Journal of electronic materials, 2007-07, Vol.36 (7), p.704-710 [Periódico revisado por pares]

Warrendale: Springer Nature B.V

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10
The aging effect of the thermoelectric power of thin copper films
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The aging effect of the thermoelectric power of thin copper films

Olson, Roy ; Downey, John

Thin solid films, 1977-01, Vol.45 (1), p.183-188 [Periódico revisado por pares]

Elsevier B.V

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