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Degradation Tracking of Rolling Bearings Based on Local Polynomial Phase Space Warping
Degradation Tracking of Rolling Bearings Based on Local Polynomial Phase Space Warping
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Degradation Tracking of Rolling Bearings Based on Local Polynomial Phase Space Warping

Liu, Hengyu ; Yuan, Rui ; Lv, Yong ; Yang, Xingkai ; Li, Hewenxuan ; Song, Gangbing

IEEE transactions on reliability, 2024-06, Vol.73 (2), p.1380-1392 [Periódico revisado por pares]

New York: IEEE

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2
Mission Abort Policy in Heterogeneous Nonrepairable 1-Out-of-N Warm Standby Systems
Mission Abort Policy in Heterogeneous Nonrepairable 1-Out-of-N Warm Standby Systems
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Mission Abort Policy in Heterogeneous Nonrepairable 1-Out-of-N Warm Standby Systems

Levitin, Gregory ; Xing, Liudong ; Dai, Yuanshun

IEEE transactions on reliability, 2018-03, Vol.67 (1), p.342-354 [Periódico revisado por pares]

New York: IEEE

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3
Improved Locality Preserving Projections Based on Heat-Kernel and Cosine Weights for Fault Classification in Complex Industrial Processes
Improved Locality Preserving Projections Based on Heat-Kernel and Cosine Weights for Fault Classification in Complex Industrial Processes
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Improved Locality Preserving Projections Based on Heat-Kernel and Cosine Weights for Fault Classification in Complex Industrial Processes

Zhang, Ning ; Xu, Yuan ; Zhu, Qun-Xiong ; He, Yan-Lin

IEEE transactions on reliability, 2023-03, Vol.72 (1), p.204-213 [Periódico revisado por pares]

New York: IEEE

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4
A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability
A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability
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A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability

Zheng, Jian-Fei ; Si, Xiao-Sheng ; Hu, Chang-Hua ; Zhang, Zheng-Xin ; Jiang, Wei

IEEE transactions on reliability, 2016-06, Vol.65 (2), p.736-750 [Periódico revisado por pares]

New York: IEEE

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5
Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks
Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks
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Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks

Li, W. ; Pham, H.

IEEE transactions on reliability, 2005-06, Vol.54 (2), p.297-303 [Periódico revisado por pares]

New York: IEEE

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6
A Multiple-Valued Decision-Diagram-Based Approach to Solve Dynamic Fault Trees
A Multiple-Valued Decision-Diagram-Based Approach to Solve Dynamic Fault Trees
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A Multiple-Valued Decision-Diagram-Based Approach to Solve Dynamic Fault Trees

Mo, Yuchang

IEEE transactions on reliability, 2014-03, Vol.63 (1), p.81-93 [Periódico revisado por pares]

New York: IEEE

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7
k-out-of- n:G System Reliability With Imperfect Fault Coverage
k-out-of- n:G System Reliability With Imperfect Fault Coverage
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k-out-of- n:G System Reliability With Imperfect Fault Coverage

Myers, A.F.

IEEE transactions on reliability, 2007-09, Vol.56 (3), p.464-473 [Periódico revisado por pares]

New York: IEEE

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8
Developments and Applications of the Finite Markov Chain Imbedding Approach in Reliability
Developments and Applications of the Finite Markov Chain Imbedding Approach in Reliability
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Developments and Applications of the Finite Markov Chain Imbedding Approach in Reliability

Cui, Lirong ; Xu, Yu ; Zhao, Xian

IEEE transactions on reliability, 2010-12, Vol.59 (4), p.685-690 [Periódico revisado por pares]

New York: IEEE

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9
An Analysis of Availability for Series Markov Repairable System With Neglected or Delayed Failures
An Analysis of Availability for Series Markov Repairable System With Neglected or Delayed Failures
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An Analysis of Availability for Series Markov Repairable System With Neglected or Delayed Failures

Bao, Xinzhuo ; Cui, Lirong

IEEE transactions on reliability, 2010-12, Vol.59 (4), p.734-743 [Periódico revisado por pares]

New York: IEEE

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10
Software reliability growth with test coverage
Software reliability growth with test coverage
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Software reliability growth with test coverage

Malaiya, Y.K. ; Li, M.N. ; Bieman, J.M. ; Karcich, R.

IEEE transactions on reliability, 2002-12, Vol.51 (4), p.420-426 [Periódico revisado por pares]

New York: IEEE

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