skip to main content
Idioma:
Resultados 1 2 3 next page
Refinado por: assunto: Redundancy remover Ieee Transactions On Reliability remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
ACEDR: Automatic Compiler Error Detection and Recovery for COTS CPU and Caches
ACEDR: Automatic Compiler Error Detection and Recovery for COTS CPU and Caches
Material Type:
Artigo 		Adicionar ao Meu Espaço

ACEDR: Automatic Compiler Error Detection and Recovery for COTS CPU and Caches

Nezzari, Y. ; Bridges, C. P.

IEEE transactions on reliability, 2019-09, Vol.68 (3), p.859-871 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
2
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches
Material Type:
Artigo 		Adicionar ao Meu Espaço

Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches

Sanchez-Clemente, Antonio J. ; Entrena, Luis ; Hrbacek, Radek ; Sekanina, Lukas

IEEE transactions on reliability, 2016-12, Vol.65 (4), p.1871-1883 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
3
Minimum Mission Cost Cold-Standby Sequencing in Non-Repairable Multi-Phase Systems
Minimum Mission Cost Cold-Standby Sequencing in Non-Repairable Multi-Phase Systems
Material Type:
Artigo 		Adicionar ao Meu Espaço

Minimum Mission Cost Cold-Standby Sequencing in Non-Repairable Multi-Phase Systems

Levitin, Gregory ; Liudong Xing ; Yuanshun Dai

IEEE transactions on reliability, 2014-03, Vol.63 (1), p.251-258 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
4
k-out-of- n:G System Reliability With Imperfect Fault Coverage
k-out-of- n:G System Reliability With Imperfect Fault Coverage
Material Type:
Artigo 		Adicionar ao Meu Espaço

k-out-of- n:G System Reliability With Imperfect Fault Coverage

Myers, A.F.

IEEE transactions on reliability, 2007-09, Vol.56 (3), p.464-473 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
5
Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method
Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method
Material Type:
Artigo 		Adicionar ao Meu Espaço

Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method

Onishi, J. ; Kimura, S. ; James, R.J.W. ; Nakagawa, Y.

IEEE transactions on reliability, 2007-03, Vol.56 (1), p.94-101 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
6
A Logarithmic Binary Decision Diagram-Based Method for Multistate System Analysis
A Logarithmic Binary Decision Diagram-Based Method for Multistate System Analysis
Material Type:
Artigo 		Adicionar ao Meu Espaço

A Logarithmic Binary Decision Diagram-Based Method for Multistate System Analysis

Shrestha, A. ; Liudong Xing

IEEE transactions on reliability, 2008-12, Vol.57 (4), p.595-606 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
7
Design of a fault tolerant solid state mass memory
Design of a fault tolerant solid state mass memory
Material Type:
Artigo 		Adicionar ao Meu Espaço

Design of a fault tolerant solid state mass memory

Cardarilli, G.C. ; Leandri, A. ; Marinucci, P. ; Ottavi, M. ; Pontarelli, S. ; Re, M. ; Salsano, A.

IEEE transactions on reliability, 2003-12, Vol.52 (4), p.476-491 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
8
Efficient Reliability Assessment of Redundant Systems Subject to Imperfect Fault Coverage Using Binary Decision Diagrams
Efficient Reliability Assessment of Redundant Systems Subject to Imperfect Fault Coverage Using Binary Decision Diagrams
Material Type:
Artigo 		Adicionar ao Meu Espaço

Efficient Reliability Assessment of Redundant Systems Subject to Imperfect Fault Coverage Using Binary Decision Diagrams

Myers, A. ; Rauzy, A.

IEEE transactions on reliability, 2008-06, Vol.57 (2), p.336-348 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
9
Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization
Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization
Material Type:
Artigo 		Adicionar ao Meu Espaço

Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization

Agarwal, M. ; Gupta, R.

IEEE transactions on reliability, 2005-09, Vol.54 (3), p.549-558 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
10
Hierarchical Variance Decomposition of System Reliability Estimates With Duplicated Components
Hierarchical Variance Decomposition of System Reliability Estimates With Duplicated Components
Material Type:
Artigo 		Adicionar ao Meu Espaço

Hierarchical Variance Decomposition of System Reliability Estimates With Duplicated Components

Tongdan Jin, Tongdan Jin

IEEE transactions on reliability, 2008-12, Vol.57 (4), p.564-573 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
Resultados 1 2 3 next page

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.