Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Substantial crystalline topology in amorphous siliconGibson, J M ; Treacy, M M J ; Sun, T ; Zaluzec, N JPhys. Rev. Lett, 2010-09, Vol.105 (12), p.125504-125504, Article 125504 [Periódico revisado por pares]United StatesTexto completo disponível |
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2 |
Material Type: Artigo
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Minimagnetospheres above the lunar surface and the formation of lunar swirlsBamford, R A ; Kellett, B ; Bradford, W J ; Norberg, C ; Thornton, A ; Gibson, K J ; Crawford, I A ; Silva, L ; Gargaté, L ; Bingham, RPhysical review letters, 2012-08, Vol.109 (8), p.081101-081101, Article 081101 [Periódico revisado por pares]United StatesTexto completo disponível |
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3 |
Material Type: Artigo
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Optical Rogue Waves in Vortex TurbulenceGibson, Christopher J ; Yao, Alison M ; Oppo, Gian-LucaPhysical review letters, 2016-01, Vol.116 (4), p.043903-043903, Article 043903 [Periódico revisado por pares]United StatesTexto completo disponível |
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4 |
Material Type: Artigo
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Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperatureVoyles, P M ; Gerbi, J E ; Treacy, M M ; Gibson, J M ; Abelson, J RPhysical review letters, 2001-06, Vol.86 (24), p.5514-5517 [Periódico revisado por pares]United States: The American Physical SocietyTexto completo disponível |
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5 |
Material Type: Artigo
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Burrowing of Co Nanoparticles on Clean Cu and Ag SurfacesZimmermann, C. G. ; Yeadon, M. ; Nordlund, K. ; Gibson, J. M. ; Averback, R. S. ; Herr, U. ; Samwer, K.Physical Review Letters, 1999-08, Vol.83 (6), p.1163-1166 [Periódico revisado por pares]United StatesTexto completo disponível |
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6 |
Material Type: Artigo
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Diminished Medium-Range Order Observed in Annealed Amorphous GermaniumGibson, J. M. ; Treacy, M. M. J.Physical review letters, 1997-02, Vol.78 (6), p.1074-1077 [Periódico revisado por pares]Texto completo disponível |
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7 |
Material Type: Artigo
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Strain evolution in coherent Ge/Si islandsLiu, CP ; Gibson, JM ; Cahill, DG ; Kamins, TI ; Basile, DP ; Williams, RSPhysical review letters, 2000-02, Vol.84 (9), p.1958-1961 [Periódico revisado por pares]United StatesTexto completo disponível |
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8 |
Material Type: Artigo
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Formation of ultrathin single-crystal silicide films on Si: surface and interfacial stabilization of Si-NiSi2 epitaxial structuresTUNG, R. T ; GIBSON, J. M ; POATE, J. MPhysical review letters, 1983-02, Vol.50 (6), p.429-432 [Periódico revisado por pares]Ridge, NY: American Physical SocietyTexto completo disponível |
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9 |
Material Type: Artigo
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Direct imaging of a novel silicon surface reconstructionGIBSON, J. M ; MCDONALD, M. L ; UNTERWALD, F. CPhysical review letters, 1985-10, Vol.55 (17), p.1765-1767 [Periódico revisado por pares]Ridge, NY: American Physical SocietyTexto completo disponível |
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10 |
Material Type: Artigo
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Evidence for a dimer reconstruction at a metal-silicon interfaceLORETTO, D ; GIBSON, J. M ; YALISOVE, S. MPhysical review letters, 1989-07, Vol.63 (3), p.298-301 [Periódico revisado por pares]Ridge, NY: American Physical SocietyTexto completo disponível |