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Measurement of axial phase difference of density fluctuations owing to spontaneously excited waves by using microwave reflectometer on GAMMA 10/PDX
Measurement of axial phase difference of density fluctuations owing to spontaneously excited waves by using microwave reflectometer on GAMMA 10/PDX
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Measurement of axial phase difference of density fluctuations owing to spontaneously excited waves by using microwave reflectometer on GAMMA 10/PDX

Sekine, R. ; Hirata, M. ; Ikezoe, R. ; Jang, S. ; Kubota, Y. ; Kayano, H. ; Sugata, K. ; Aizawa, T. ; Noguchi, D. ; Kim, D. ; Sugimoto, Y. ; Matsuura, R. ; Yamazaki, H. ; Ichimura, M. ; Yoshikawa, M. ; Kohagura, J. ; Nakashima, Y. ; Ezumi, N. ; Sakamoto, M.

Review of scientific instruments, 2021-05, Vol.92 (5), p.053506-053506 [Periódico revisado por pares]

Melville: American Institute of Physics

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2
Multi-point measurement using two-channel reflectometer with antenna switching for study of high-frequency fluctuations in GAMMA 10
Multi-point measurement using two-channel reflectometer with antenna switching for study of high-frequency fluctuations in GAMMA 10
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Multi-point measurement using two-channel reflectometer with antenna switching for study of high-frequency fluctuations in GAMMA 10

Ikezoe, R. ; Ichimura, M. ; Okada, T. ; Itagaki, J. ; Hirata, M. ; Sumida, S. ; Jang, S. ; Izumi, K. ; Tanaka, A. ; Yoshikawa, M. ; Kohagura, J. ; Sakamoto, M. ; Nakashima, Y.

Review of scientific instruments, 2017-03, Vol.88 (3), p.033504-033504 [Periódico revisado por pares]

United States: American Institute of Physics

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3
A new frequency-multiplied interferometer system in the GAMMA 10 tandem mirror
A new frequency-multiplied interferometer system in the GAMMA 10 tandem mirror
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A new frequency-multiplied interferometer system in the GAMMA 10 tandem mirror

Kohagura, J ; Yoshikawa, M ; Shima, Y ; Morikawa, Y ; Yamada, T ; Akita, D ; Tatebe, K ; Ichimura, M ; Hirata, M ; Ikezoe, R ; Yokoyama, T ; Imai, T

Review of scientific instruments, 2012-10, Vol.83 (10), p.10E310-10E310 [Periódico revisado por pares]

United States

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4
Cross comparison of thin-film tensile-testing methods examined using single-crystal silicon, polysilicon, nickel, and titanium films
Cross comparison of thin-film tensile-testing methods examined using single-crystal silicon, polysilicon, nickel, and titanium films
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Cross comparison of thin-film tensile-testing methods examined using single-crystal silicon, polysilicon, nickel, and titanium films

Tsuchiya, T. ; Hirata, M. ; Chiba, N. ; Udo, R. ; Yoshitomi, Y. ; Ando, T. ; Sato, K. ; Takashima, K. ; Higo, Y. ; Saotome, Y. ; Ogawa, H. ; Ozaki, K.

Journal of microelectromechanical systems, 2005-10, Vol.14 (5), p.1178-1186 [Periódico revisado por pares]

New York, NY: IEEE

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5
Generation and pressure measurement of extremely high vacuum (XHV) using a TiN coated chamber
Generation and pressure measurement of extremely high vacuum (XHV) using a TiN coated chamber
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Generation and pressure measurement of extremely high vacuum (XHV) using a TiN coated chamber

Akimichi, H ; Hirata, M

Metrologia, 2005-12, Vol.42 (6), p.S184-S186 [Periódico revisado por pares]

Bristol: IOP Publishing

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6
Development of small differential pressure standard using double pressure balances
Development of small differential pressure standard using double pressure balances
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Development of small differential pressure standard using double pressure balances

Kojima, M ; Kobata, T ; Saitou, K ; Hirata, M

Metrologia, 2005-12, Vol.42 (6), p.S227-S230 [Periódico revisado por pares]

Bristol: IOP Publishing

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7
Electron density fluctuation measurements using a multichannel microwave interferometer in GAMMA 10
Electron density fluctuation measurements using a multichannel microwave interferometer in GAMMA 10
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Electron density fluctuation measurements using a multichannel microwave interferometer in GAMMA 10

Yoshikawa, M. ; Shima, Y. ; Matsumoto, T. ; Nakahara, A. ; Yanagi, N. ; Itakura, A. ; Hojo, H. ; Kobayashi, T. ; Matama, K. ; Tatematsu, Y. ; Imai, T. ; Kohagura, J. ; Hirata, M. ; Nakashima, Y. ; Cho, T.

Review of scientific instruments, 2006-10, Vol.77 (10), p.10E906-10E906-3 [Periódico revisado por pares]

United States: American Institute of Physics

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8
Novel compact electrostatic ion-current detector using a self-collection method for secondary-electron suppression
Novel compact electrostatic ion-current detector using a self-collection method for secondary-electron suppression
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Novel compact electrostatic ion-current detector using a self-collection method for secondary-electron suppression

Hirata, M. ; Tokioka, S. ; Cho, T. ; Kohagura, J. ; Yoshida, M. ; Miyake, Y. ; Numakura, T. ; Yokoyama, N. ; Fukai, T. ; Tomii, Y. ; Nakashima, Y. ; Miyoshi, S. ; Kondoh, T.

Review of Scientific Instruments, 2004-10, Vol.75 (10), p.3631-3633 [Periódico revisado por pares]

United States

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9
Observations of differences in the spatial-profile symmetry-of ion-confining potentials in the cases with and without the central-cell density increase during an ion-plugging period
Observations of differences in the spatial-profile symmetry-of ion-confining potentials in the cases with and without the central-cell density increase during an ion-plugging period
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Observations of differences in the spatial-profile symmetry-of ion-confining potentials in the cases with and without the central-cell density increase during an ion-plugging period

Yoshida, M. ; Cho, T. ; Hirata, M. ; Ito, H. ; Kohagura, J. ; Yatsu, K. ; Miyoshi, S.

Review of Scientific Instruments, 2003-03, Vol.74 (3), p.1909-1912 [Periódico revisado por pares]

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10
Observations of sheared radial electric-field effects on turbulence suppression
Observations of sheared radial electric-field effects on turbulence suppression
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Observations of sheared radial electric-field effects on turbulence suppression

Yoshida, M. ; Cho, T. ; Hirata, M. ; Tokioka, S. ; Miyake, Y. ; Numakura, T. ; Kohagura, J. ; Miyoshi, S.

Review of Scientific Instruments, 2004-10, Vol.75 (10), p.4344-4346 [Periódico revisado por pares]

United States

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