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Microstructured TiO2 coatings by anodization of Ti6Al4V with oxalic acid
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Microstructured TiO2 coatings by anodization of Ti6Al4V with oxalic acid

Ferreira-Palma, Carlos ; García-González, Leandro ; Hernández-Montiel, Samuel ; López-Hirata, Víctor M. ; Beltrán-Zúñiga, Manuel A. ; Hernández-Torres, Julián ; Zamora-Peredo, Luis ; Dorantes-Rosales, Héctor J.

Applied physics. A, Materials science & processing, 2023-02, Vol.129 (2), Article 114 [Periódico revisado por pares]

Berlin/Heidelberg: Springer Berlin Heidelberg

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Measurement of axial phase difference of density fluctuations owing to spontaneously excited waves by using microwave reflectometer on GAMMA 10/PDX
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Measurement of axial phase difference of density fluctuations owing to spontaneously excited waves by using microwave reflectometer on GAMMA 10/PDX

Sekine, R. ; Hirata, M. ; Ikezoe, R. ; Jang, S. ; Kubota, Y. ; Kayano, H. ; Sugata, K. ; Aizawa, T. ; Noguchi, D. ; Kim, D. ; Sugimoto, Y. ; Matsuura, R. ; Yamazaki, H. ; Ichimura, M. ; Yoshikawa, M. ; Kohagura, J. ; Nakashima, Y. ; Ezumi, N. ; Sakamoto, M.

Review of scientific instruments, 2021-05, Vol.92 (5), p.053506-053506 [Periódico revisado por pares]

Melville: American Institute of Physics

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3
Study of detached plasma profile in the divertor simulation experimental module of tandem mirror GAMMA 10/PDX
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Study of detached plasma profile in the divertor simulation experimental module of tandem mirror GAMMA 10/PDX

Yoshikawa, M. ; Kohagura, J. ; Ezumi, N. ; Iijima, T. ; Nojiri, K. ; Terakado, A. ; Nakashima, Y. ; Kariya, T. ; Numakura, T. ; Hirata, M. ; Minami, R. ; Sakamoto, M. ; Ichimura, M. ; Islam, M. S. ; Shima, Y. ; Yasuhara, R. ; Yamada, I. ; Funaba, H. ; Minami, T. ; Kenmochi, N. ; Kuwahara, D. ; van der Meiden, H. J.

AIP advances, 2021-12, Vol.11 (12), p.125231-125231-6 [Periódico revisado por pares]

Melville: American Institute of Physics

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Performance of Cr oxide coatings on 304 steel against metal dusting
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Performance of Cr oxide coatings on 304 steel against metal dusting

Melo-Máximo, L. ; Salas, O. ; Melo-Máximo, D. ; Oseguera, J. ; López-Hirata, V.M. ; Torres, R.D. ; Lepienski, C.M. ; de Souza, R.M.

Surface & coatings technology, 2013-12, Vol.237, p.39-50 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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5
Pairing interaction in superconducting UCoGe tunable by magnetic field
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Pairing interaction in superconducting UCoGe tunable by magnetic field

Ishida, K. ; Matsuzaki, S. ; Manago, M. ; Hattori, T. ; Kitagawa, S. ; Hirata, M. ; Sasaki, T. ; Aoki, D.

Physical review. B, 2021-10, Vol.104 (14), Article 144505 [Periódico revisado por pares]

College Park: American Physical Society

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6
Final-State Control Using Polynomial and Time-Series Data
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Final-State Control Using Polynomial and Time-Series Data

Hirata, M. ; Ueno, F.

IEEE transactions on magnetics, 2011-07, Vol.47 (7), p.1944-1950

New York, NY: IEEE

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7
Multi-point measurement using two-channel reflectometer with antenna switching for study of high-frequency fluctuations in GAMMA 10
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Multi-point measurement using two-channel reflectometer with antenna switching for study of high-frequency fluctuations in GAMMA 10

Ikezoe, R. ; Ichimura, M. ; Okada, T. ; Itagaki, J. ; Hirata, M. ; Sumida, S. ; Jang, S. ; Izumi, K. ; Tanaka, A. ; Yoshikawa, M. ; Kohagura, J. ; Sakamoto, M. ; Nakashima, Y.

Review of scientific instruments, 2017-03, Vol.88 (3), p.033504-033504 [Periódico revisado por pares]

United States: American Institute of Physics

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8
A new frequency-multiplied interferometer system in the GAMMA 10 tandem mirror
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A new frequency-multiplied interferometer system in the GAMMA 10 tandem mirror

Kohagura, J ; Yoshikawa, M ; Shima, Y ; Morikawa, Y ; Yamada, T ; Akita, D ; Tatebe, K ; Ichimura, M ; Hirata, M ; Ikezoe, R ; Yokoyama, T ; Imai, T

Review of scientific instruments, 2012-10, Vol.83 (10), p.10E310-10E310 [Periódico revisado por pares]

United States

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9
Cross comparison of thin-film tensile-testing methods examined using single-crystal silicon, polysilicon, nickel, and titanium films
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Cross comparison of thin-film tensile-testing methods examined using single-crystal silicon, polysilicon, nickel, and titanium films

Tsuchiya, T. ; Hirata, M. ; Chiba, N. ; Udo, R. ; Yoshitomi, Y. ; Ando, T. ; Sato, K. ; Takashima, K. ; Higo, Y. ; Saotome, Y. ; Ogawa, H. ; Ozaki, K.

Journal of microelectromechanical systems, 2005-10, Vol.14 (5), p.1178-1186 [Periódico revisado por pares]

New York, NY: IEEE

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10
Mechanisms of dissociative excitation of BrCN in electron cyclotron resonance plasmas of Ar and He
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Mechanisms of dissociative excitation of BrCN in electron cyclotron resonance plasmas of Ar and He

Ito, H ; Hayashi, H ; Hirata, M ; Watanabe, Y

Journal of physics. D, Applied physics, 2008-04, Vol.41 (8), p.085201-085201 (7) [Periódico revisado por pares]

Bristol: IOP Publishing

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