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Material Type: Artigo
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Nano-mechanical properties of silver-welded YBCO bulksRoa, J J ; Bartolomé, E ; Bozzo, B ; Capdevila, X G ; Granados, X ; Segarra, MJournal of physics. Conference series, 2010-06, Vol.234 (1), p.012034 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Self-oriented Ag-based polycrystalline cubic nanostructures through polymer stabilizationAlonso, Amanda ; Vigués, Núria ; Rodríguez-Rodríguez, Rosalía ; Borrisé, Xavier ; Muñoz, María ; Muraviev, Dmitri N ; Mas, Jordi ; Muñoz-Berbel, XavierNanotechnology, 2016-10, Vol.27 (42), p.425603 [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Electrostatics of two-dimensional lateral junctionsChaves, Ferney A ; Jiménez, DavidNanotechnology, 2018-07, Vol.29 (27), p.275203-275203 [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Small-signal parameters extraction and noise analysis of CNTFETsRamos-Silva, Javier N ; Pacheco-Sánchez, Aníbal ; Enciso-Aguilar, Mauro A ; Jiménez, David ; Ramírez-García, EloySemiconductor science and technology, 2020-04, Vol.35 (4), p.45024 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Scaling of graphene field-effect transistors supported on hexagonal boron nitride: radio-frequency stability as a limiting factorFeijoo, Pedro C ; Pasadas, Francisco ; Iglesias, José M ; Martín, María J ; Rengel, Raúl ; Li, Changfeng ; Kim, Wonjae ; Riikonen, Juha ; Lipsanen, Harri ; Jiménez, DavidNanotechnology, 2017-12, Vol.28 (48), p.485203-485203 [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Neural network based analysis of random telegraph noise in resistive random access memoriesGonzález-Cordero, G ; González, M B ; Morell, A ; Jiménez-Molinos, F ; Campabadal, F ; Roldán, J BSemiconductor science and technology, 2020-02, Vol.35 (2), p.25021 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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Material Type: Artigo
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High-k gadolinium scandate on Si obtained by high pressure sputtering from metal targets and in-situ plasma oxidationPampillón, M A ; San Andrés, E ; Feijoo, P C ; Fierro, J L GSemiconductor science and technology, 2017-03, Vol.32 (3), p.35016 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Tolerance analysis of a GFET transistor for aerospace and aeronautical applicationLamberti, P ; Mura, M La ; Pasadas, F ; Jiménez, D ; Tucci, VIOP conference series. Materials Science and Engineering, 2021-01, Vol.1024 (1), p.12005 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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YOLO Algorithm Accuracy Analysis in Detecting Amount of Vehicles at the IntersectionDewantoro, N ; Fernando, P N ; Tan, SofyanIOP conference series. Earth and environmental science, 2020-02, Vol.426 (1), p.12164 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Lattice dynamics of CdGeAs2Pujol, J ; Artús, L ; Pascual, J ; Camassel, JPhysica scripta, 1990-05, Vol.41 (5), p.696-698 [Periódico revisado por pares]Stockholm: IOP PublishingTexto completo disponível |