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Material Type: Artigo
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Test Schedules for VLSI Circuits Having Built-In Test HardwareAbadir, M S ; Breuer, M AIEEE transactions on computers, 1986-04, Vol.C-35 (4), p.361-367 [Periódico revisado por pares]IEEETexto completo disponível |
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New Techniques for Improving the Performance of the Lockstep Architecture for SEEs Mitigation in FPGA Embedded ProcessorsAbate, F. ; Sterpone, L. ; Lisboa, C.A. ; Carro, L. ; Violante, M.IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.1992-2000 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Performance of the Alex AVX-2 MIMD architecture in learning the NetTalk databaseAbbas, H.M.IEEE transactions on neural networks, 2004-03, Vol.15 (2), p.505-514United States: IEEETexto completo disponível |
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Material Type: Artigo
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ZayyuNet - A Unified Deep Learning Model for the Identification of Epigenetic Modifications Using Raw Genomic SequencesAbbas, Zeeshan ; Tayara, Hilal ; Chong, Kil ToIEEE/ACM transactions on computational biology and bioinformatics, 2022-07, Vol.19 (4), p.2533-2544 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Superresolution algorithms for a modified Hopfield neural networkAbbiss, J.B. ; Brames, B.J. ; Fiddy, M.A.IEEE transactions on signal processing, 1991-07, Vol.39 (7), p.1516-1523 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Key management for restricted multicast using broadcast encryptionAbdalla, M. ; Shavitt, Y. ; Wool, A.IEEE/ACM transactions on networking, 2000-08, Vol.8 (4), p.443-454 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Unsupervised analysis of polyphonic music by sparse codingAbdallah, S.A. ; Plumbley, M.D.IEEE transactions on neural networks, 2006-01, Vol.17 (1), p.179-196New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Optical Fiber Fault Detection and Localization in a Noisy OTDR Trace Based on Denoising Convolutional Autoencoder and Bidirectional Long Short-Term MemoryAbdelli, Khouloud ; Grieser, Helmut ; Tropschug, Carsten ; Pachnicke, StephanJournal of lightwave technology, 2022-04, Vol.40 (8), p.2254-2264 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Worst Case Test Vectors for Sequential Circuits in Flash-Based FPGAs Exposed to Total DoseAbdelwahab, M. S. ; Abdel-Azizz, M. M. ; Abdelgawad, M. M. ; Abou-Auf, A. A. ; Ibrahim, M. A.IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1642-1650 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Automatic Quality Assessment of Echocardiograms Using Convolutional Neural Networks: Feasibility on the Apical Four-Chamber ViewAbdi, Amir H. ; Luong, Christina ; Tsang, Teresa ; Allan, Gregory ; Nouranian, Saman ; Jue, John ; Hawley, Dale ; Fleming, Sarah ; Gin, Ken ; Swift, Jody ; Rohling, Robert ; Abolmaesumi, PurangIEEE transactions on medical imaging, 2017-06, Vol.36 (6), p.1221-1230United States: IEEETexto completo disponível |