Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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The effects of pressure on the deposition rate in rf sputtering processesPriestland, CRD ; Hersee, S.D.Vacuum, 1972-03, Vol.22 (3), p.103-106 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
2 |
Material Type: Artigo
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Variation of lattice parameter with temperature and thermal expansion of the compound Cu2SnSe3Sharma, B. B. ; Chavada, F. R.Physica status solidi. A, Applied research, 1972-12, Vol.14 (2), p.639-642 [Periódico revisado por pares]Berlin: WILEY-VCH VerlagTexto completo disponível |
3 |
Material Type: Artigo
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Structural and electrical properties of evaporated Cr-Ni films as a function of gas pressureLassak, L. ; Hieber, K.Thin solid films, 1973-01, Vol.17 (1), p.105-111 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
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The X-Ray laue diffraction near the absorption k-edges of the GaAs lattice atomsGureev, A. N. ; Gudzenko, G. I. ; Datsenko, L. I. ; Molodkin, V. B.Physica status solidi. A, Applied research, 1973-09, Vol.19 (1), p.319-330Berlin: WILEY-VCH VerlagTexto completo disponível |
5 |
Material Type: Artigo
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X-ray absorption at Laue diffraction in an elastically distorted single crystalDatsenko, L. I. ; Kislovskii, E. N. ; Vasilkovskii, A. S.Physica status solidi. A, Applied research, 1974-05, Vol.23 (1), p.215-221 [Periódico revisado por pares]Berlin: WILEY-VCH VerlagTexto completo disponível |
6 |
Material Type: Artigo
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Structural perfection of the GeSi and SiGe heteroepitaxial systemsVasilevskaya, V.N. ; Datsenko, L.I. ; Osadchaya, N.V. ; Prokopenko, I.V. ; Soldatenko, N.N. ; Tkhorik, Yu.A.Thin solid films, 1974-07, Vol.22 (3), p.221-229 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
7 |
Material Type: Artigo
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Anomalous transmission of X-rays in CdSb single crystalsMelnichuk, I. V. ; Nikulitsa, V. G. ; Rarenko, I. M.Physica status solidi. A, Applied research, 1974-10, Vol.25 (2), p.K173-K176 [Periódico revisado por pares]Berlin: WILEY-VCH VerlagTexto completo disponível |
8 |
Material Type: Artigo
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Reactively evaporated BeO films: Preparation and electrical and optical propertiesTschulena, G.Thin solid films, 1976-01, Vol.39 (1-2-3), p.175-183 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
9 |
Material Type: Artigo
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Effect of crystal net plane curvature on X-ray intensity in the case of Laue diffractionKislovskii, E. N. ; Datsenko, L. I. ; Vasilkovskh, A. S.Physica status solidi. A, Applied research, 1976-01, Vol.33 (1), p.275-280Berlin: WILEY-VCH VerlagTexto completo disponível |
10 |
Material Type: Artigo
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Radiation damage (blistering) in Al, Cu, Si by exposure to a plasma focus dischargeBostick, W.H. ; Nardi, V. ; Prior, W. ; Choi, J. ; Fillingham, P.J. ; Cortese, C.Journal of nuclear materials, 1976-12, Vol.63 (1), p.356-372 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |