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Material Type: Artigo
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The k-means Algorithm: A Comprehensive Survey and Performance EvaluationAhmed, Mohiuddin ; Seraj, Raihan ; Islam, Syed Mohammed ShamsulElectronics (Basel), 2020-08, Vol.9 (8), p.1295 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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Machine Learning Interpretability: A Survey on Methods and MetricsCarvalho, Diogo V. ; Pereira, Eduardo M. ; Cardoso, Jaime S.Electronics (Basel), 2019-08, Vol.8 (8), p.832 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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Conduction Mechanism of Valence Change Resistive Switching Memory: A SurveyLim, Ee ; Ismail, RazaliElectronics, 2015-09, Vol.4 (3), p.586-613 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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Role of IoT Technology in Agriculture: A Systematic Literature ReviewFarooq, Muhammad Shoaib ; Riaz, Shamyla ; Abid, Adnan ; Umer, Tariq ; Zikria, Yousaf BinElectronics (Basel), 2020-02, Vol.9 (2), p.319 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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A Novel PCA-Firefly Based XGBoost Classification Model for Intrusion Detection in Networks Using GPUBhattacharya, Sweta ; S, Siva Rama Krishnan ; Maddikunta, Praveen Kumar Reddy ; Kaluri, Rajesh ; Singh, Saurabh ; Gadekallu, Thippa Reddy ; Alazab, Mamoun ; Tariq, UsmanElectronics (Basel), 2020-02, Vol.9 (2), p.219 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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A Comparative Analysis of Object Detection Metrics with a Companion Open-Source ToolkitPadilla, Rafael ; Passos, Wesley L. ; Dias, Thadeu L. B. ; Netto, Sergio L. ; da Silva, Eduardo A. B.Electronics (Basel), 2021-02, Vol.10 (3), p.279 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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Evaluating the Quality of Machine Learning Explanations: A Survey on Methods and MetricsZhou, Jianlong ; Gandomi, Amir H. ; Chen, Fang ; Holzinger, AndreasElectronics (Basel), 2021-03, Vol.10 (5), p.593 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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A Survey on LiDAR Scanning MechanismsRaj, Thinal ; Hashim, Fazida Hanim ; Huddin, Aqilah Baseri ; Ibrahim, Mohd Faisal ; Hussain, AiniElectronics (Basel), 2020-05, Vol.9 (5), p.741 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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CNN Variants for Computer Vision: History, Architecture, Application, Challenges and Future ScopeBhatt, Dulari ; Patel, Chirag ; Talsania, Hardik ; Patel, Jigar ; Vaghela, Rasmika ; Pandya, Sharnil ; Modi, Kirit ; Ghayvat, HemantElectronics (Basel), 2021-10, Vol.10 (20), p.2470 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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A 14-Bit Digital to Analog Converter for a Topmetal-CEE Pixel Readout ChipDeng, Yunqi ; Yang, Ping ; Huang, Guangming ; Liu, Jun ; Ren, Zhongguang ; Fan, Yan ; Song, ZixuanElectronics (Basel), 2024-08, Vol.13 (15), p.3074 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |