Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Method of HWIL simulation for the dual-mode optical sensorYonezawa, Toru ; Kinoshita, Toshiya ; Ohtake, Ryuji ; Nakajima, Hisayuki ; Miyauchi, HiroshiSPIE proceedings series, 1999, Vol.3697, p.120-127Bellingham WA: SPIETexto completo disponível |
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2 |
Material Type: Artigo
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Completion and trial operation of the superconducting magnets for the Large Helical DeviceSatow, T. ; Yanagi, N. ; Imagawa, S. ; Tamura, H. ; Takahata, K. ; Mito, T. ; Chikaraishi, H. ; Yamada, S. ; Nishimura, A. ; Maekawa, R. ; Iwamoto, A. ; Inoue, N. ; Nakamura, Y. ; Watanabe, K. ; Yamada, H. ; Komori, A. ; Ohtake, I. ; Iima, M. ; Satoh, S. ; Motojima, O.IEEE transactions on applied superconductivity, 1999-06, Vol.9 (2), p.1008-1011 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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First cool-down performance of the LHDMito, T. ; Maekawa, R. ; Yamada, S. ; Nishimura, A. ; Takahata, K. ; Iwamoto, A. ; Imagawa, S. ; Watanabe, K. ; Yanagi, N. ; Tamura, H. ; Baba, T. ; Moriuchi, S. ; Ohu, K. ; Sekiguchi, H. ; Ohtake, I. ; Satow, T. ; Satoh, S. ; Motojima, O.IEEE transactions on applied superconductivity, 1999-06, Vol.9 (2), p.640-643 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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A New Test Generation Model for Broadside Transition Testing of Partial Scan CircuitsIwagaki, T. ; Ohtake, S. ; Fujiwara, H.2006 IFIP International Conference on Very Large Scale Integration, 2006, p.308-313IEEETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Demonstration of Vehicle to Vehicle Communications over TV White SpaceAltintas, O. ; Nishibori, M. ; Oshida, T. ; Yoshimura, C. ; Fujii, Y. ; Nishida, K. ; Ihara, Y. ; Saito, M. ; Tsukamoto, K. ; Tsuru, M. ; Oie, Y. ; Vuyyuru, R. ; Al Abbasi, Abdulrahman ; Ohtake, M. ; Ohta, Mai ; Fujii, T. ; Si Chen ; Pagadarai, S. ; Wyglinski, A. M.2011 IEEE Vehicular Technology Conference (VTC Fall), 2011, p.1-3IEEETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Origin of intensity errors in THz-TDS measurements: Relation between beam deflection of the fs-laser and the THz-intensity fluctuationsTakeda, M. ; Tripathi, S. R. ; Aoki, M. ; Hirano, K. ; Ohtake, H. ; Hirosumi, T. ; Hiromoto, N.2011 International Conference on Infrared, Millimeter, and Terahertz Waves, 2011, p.1-2IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Preflight and In-Flight Calibration of the Spectral Profiler on Board SELENE (Kaguya)Yamamoto, S. ; Matsunaga, T. ; Ogawa, Y. ; Nakamura, R. ; Yokota, Y. ; Ohtake, M. ; Haruyama, J. ; Morota, T. ; Honda, C. ; Hiroi, T. ; Kodama, S.IEEE transactions on geoscience and remote sensing, 2011-11, Vol.49 (11), p.4660-4676 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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8 |
Material Type: Ata de Congresso
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Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 EtchingHagiwara, Kei ; Goto, Masahide ; Iguchi, Yoshinori ; Ohtake, Hiroshi ; Saraya, Takuya ; Toshiyoshi, Hiroshi ; Higurashi, Eiji ; Hiramoto, ToshiroECS transactions, 2014, Vol.64 (5), p.391-396The Electrochemical Society, IncTexto completo disponível |