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1 |
Material Type: Artigo
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Methylcellulose - a versatile printing material that enables biofabrication of tissue equivalents with high shape fidelityAhlfeld, T ; Guduric, V ; Duin, S ; Akkineni, A. R ; Schütz, K ; Kilian, D ; Emmermacher, J ; Cubo-Mateo, N ; Dani, S ; Witzleben, M. v ; Spangenberg, J ; Abdelgaber, R ; Richter, R. F ; Lode, A ; Gelinsky, MBiomaterials science, 2020-04, Vol.8 (8), p.212-211 [Periódico revisado por pares]England: Royal Society of ChemistryTexto completo disponível |
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Material Type: Artigo
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Membrane-containing virus particles exhibit the mechanics of a composite material for genome protectionAzinas, S ; Bano, F ; Torca, I ; Bamford, D H ; Schwartz, G A ; Esnaola, J ; Oksanen, H M ; Richter, R P ; Abrescia, N GNanoscale, 2018, Vol.10 (16), p.7769-7779 [Periódico revisado por pares]England: Royal Society of ChemistryTexto completo disponível |
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Material Type: Artigo
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Coordination-driven magnetic-to-nonmagnetic transition in manganese-doped silicon clustersZamudio-Bayer, V. ; Leppert, L. ; Hirsch, K. ; Langenberg, A. ; Rittmann, J. ; Kossick, M. ; Vogel, M. ; Richter, R. ; Terasaki, A. ; Möller, T. ; v. Issendorff, B. ; Kümmel, S. ; Lau, J. T.Physical review. B, Condensed matter and materials physics, 2013-09, Vol.88 (11), Article 115425 [Periódico revisado por pares]Texto completo disponível |
4 |
Material Type: Artigo
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Electron beam physical vapour deposition and mechanical properties of c-ZrO2-ZTA-coatings on alloy 617 substratesRoos, E. ; Naga, S.M. ; Richter, R.N. ; Lauf, S. ; Awaad, M. ; Lyutovich, A. ; Tameem, M.A.Ceramics international, 2012-05, Vol.38 (4), p.3317-3326 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
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Material Type: Artigo
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Effects of different sterilisation methods on antibacterial Cu-TiO2 coatingsMauerer, A. ; Henkel, M. ; Welsch, G. H. ; Forst, R. ; Richter, R. H. ; Heidenau, F.Surface engineering, 2015-10, Vol.31 (10), p.757-762 [Periódico revisado por pares]London, England: Taylor & FrancisTexto completo disponível |
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Material Type: Artigo
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DEPMOSFET active pixel sensor prototypes for the XEUS wide field imagerTreis, J. ; Fischer, P. ; Halker, O. ; Harter, M. ; Herrmann, S. ; Kohrs, R. ; Kruger, H. ; Lechner, P. ; Lutz, G. ; Peric, I. ; Porro, M. ; Richter, R.H. ; Struder, L. ; Trimpl, M. ; Wermes, N.IEEE transactions on nuclear science, 2005-08, Vol.52 (4), p.1083-1091 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Spectroscopic performance of the DePMOS detector/amplifier device with respect to different filtering techniques and operating conditionsPorro, M. ; Ferrari, G. ; Fischer, P. ; Halker, O. ; Harter, M. ; Herrmann, S. ; Hornel, N. ; Kohrs, R. ; Krueger, H. ; Lechner, P. ; Lutz, G. ; Peric, I. ; Richter, R.H. ; Struder, L. ; Treis, J. ; Trimpl, M. ; Wermes, N.IEEE transactions on nuclear science, 2006-02, Vol.53 (1), p.401-408 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Prospects of using silicon photomultipliers for the astroparticle physics experiments EUSO and MAGICOtte, A.N. ; Dolgoshein, B. ; Hose, J. ; Klemin, S. ; Lorenz, E. ; Lutz, G. ; Mirzoyan, R. ; Popova, E. ; Richter, R.H. ; Struder, L.W.J. ; Teshima, M.IEEE transactions on nuclear science, 2006-04, Vol.53 (2), p.636-640 [Periódico revisado por pares]New York: IEEETexto completo disponível |
9 |
Material Type: Artigo
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Processing of ultra-thin silicon sensors for future e+e- linear collider experimentsAndricek, L ; Lutz, G ; Reiche, M ; Richter, R.HIEEE transactions on nuclear science, 2004-06, Vol.51 (3), p.1117-1120 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
10 |
Material Type: Artigo
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Gate length scaling trends of drive current enhancement in CMOSFETs with dual stress overlayers and embedded-SiGeFlachowsky, S. ; Wei, A. ; Herrmann, T. ; Illgen, R. ; Horstmann, M. ; Richter, R. ; Salz, H. ; Klix, W. ; Stenzel, R.Materials science & engineering. B, Solid-state materials for advanced technology, 2008-12, Vol.154, p.98-101 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |