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Refinado por: Base de dados/Biblioteca: Aluminium Industry Abstracts remover Nome da Publicação: Ieee Transactions On Applied Superconductivity remover
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Application of react-and-wind method to D-shaped test coil using the 20 kA Nb sub(3)Al conductor developed for JT-60SC
Application of react-and-wind method to D-shaped test coil using the 20 kA Nb sub(3)Al conductor developed for JT-60SC
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Application of react-and-wind method to D-shaped test coil using the 20 kA Nb sub(3)Al conductor developed for JT-60SC

Kizu, K ; Miura, Y M ; Tsuchiya, K ; Koizumi, N ; Matsui, K ; Ando, T ; Hamada, K ; Hara, E ; Imahashi, K ; Ishida, S ; Isono, T ; Kawano, K ; Kawabe, M ; Kawasaki, T ; Kubo, H ; Matsukawa, M ; Nabara, Y ; Nunoya, Y ; Okuno, K ; Ootsu, K ; Oshikiri, M ; Sakasai, A ; Seki, S ; Takano, K ; Tamai, H ; Tsutsumi, F ; Uno, Y

IEEE transactions on applied superconductivity, 2004-01, Vol.14 (2) [Periódico revisado por pares]

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2
Effects of Tensile and Compressive Strain on Critical Currents of Strand and Cable-in-Conduit Conductor
Effects of Tensile and Compressive Strain on Critical Currents of Strand and Cable-in-Conduit Conductor
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Effects of Tensile and Compressive Strain on Critical Currents of Strand and Cable-in-Conduit Conductor

Kizu, K ; Tsuchiya, K ; Shimada, K ; Ando, T ; Hishinuma, Y ; Koizumi, N ; Matsukawa, M ; Miura, Y.M ; Nishimura, A ; Okuno, K ; Seo, K ; Takahata, K ; Tamai, H ; Yamada, S

IEEE transactions on applied superconductivity, 2006-05, Vol.16 (2), p.872 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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3
Design of toroidal field coil for the JT-60 superconducting tokamak
Design of toroidal field coil for the JT-60 superconducting tokamak
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Design of toroidal field coil for the JT-60 superconducting tokamak

Tsuchiya, K. ; Kizu, K. ; Miura, Y.M. ; Ando, T. ; Isono, T. ; Matsui, K. ; Koizumi, N. ; Matsukawa, M. ; Sakasai, A. ; Ishida, S.

IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.1480-1483 [Periódico revisado por pares]

New York, NY: IEEE

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