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A comparative study of the mechanical strength of chemical vapor-deposited diamond and physical vapor-deposited hard coatings
A comparative study of the mechanical strength of chemical vapor-deposited diamond and physical vapor-deposited hard coatings
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A comparative study of the mechanical strength of chemical vapor-deposited diamond and physical vapor-deposited hard coatings

Kamiya, S. ; Nagasawa, H. ; Yamanobe, K. ; Saka, M.

Thin solid films, 2005-02, Vol.473 (1), p.123-131 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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2
Adhesion improvement of electroless plated Ni layer by ultrasonic agitation during zincating process
Adhesion improvement of electroless plated Ni layer by ultrasonic agitation during zincating process
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Adhesion improvement of electroless plated Ni layer by ultrasonic agitation during zincating process

Jin, Jeong-Gi ; Lee, Sung-Ki ; Kim, Young-Ho

Thin solid films, 2004-11, Vol.466 (1), p.272-278 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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3
Advanced thermal barrier system bond coatings for use on nickel-, cobalt- and iron-base alloy substrates
Advanced thermal barrier system bond coatings for use on nickel-, cobalt- and iron-base alloy substrates
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Advanced thermal barrier system bond coatings for use on nickel-, cobalt- and iron-base alloy substrates

Stecura, Stephan

Thin solid films, 1986-01, Vol.136 (2), p.241-256 [Periódico revisado por pares]

Legacy CDMS: Elsevier B.V

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4
Analysis of firing processes of titania gel films fabricated by sol–gel processes
Analysis of firing processes of titania gel films fabricated by sol–gel processes
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Analysis of firing processes of titania gel films fabricated by sol–gel processes

Toshikazu, Nishide ; Takayuki, Yabe ; Nobuyoshi, Miyabayashi ; Makiko, Sano

Thin solid films, 2004-11, Vol.467 (1), p.43-49 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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5
Analysis of powder X-ray diffraction resolution using collimating and focusing polycapillary optics
Analysis of powder X-ray diffraction resolution using collimating and focusing polycapillary optics
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Analysis of powder X-ray diffraction resolution using collimating and focusing polycapillary optics

Zhou, Wei ; Mahato, Dip N. ; MacDonald, C.A.

Thin solid films, 2010-07, Vol.518 (18), p.5047-5056 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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6
Anisotropic magnetoresistance in La0.67Ca0.33MnO3/YBa2Cu4O8/La0.67Ca0.33MnO3 trilayer films
Anisotropic magnetoresistance in La0.67Ca0.33MnO3/YBa2Cu4O8/La0.67Ca0.33MnO3 trilayer films
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Anisotropic magnetoresistance in La0.67Ca0.33MnO3/YBa2Cu4O8/La0.67Ca0.33MnO3 trilayer films

KUN ZHAO ; ZHANG, L ; WONG, H. K

Thin solid films, 2005-01, Vol.471 (1-2), p.287-292 [Periódico revisado por pares]

Lausanne: Elsevier Science

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7
Annealing and recrystallization of amorphous ZnO thin films deposited under cryogenic conditions by pulsed laser deposition
Annealing and recrystallization of amorphous ZnO thin films deposited under cryogenic conditions by pulsed laser deposition
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Annealing and recrystallization of amorphous ZnO thin films deposited under cryogenic conditions by pulsed laser deposition

Bruncko, J. ; Vincze, A. ; Netrvalova, M. ; Šutta, P. ; Hasko, D. ; Michalka, M.

Thin solid films, 2011-11, Vol.520 (2), p.866-870 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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8
Assembling of redox proteins on Au(111) surfaces: A scanning probe microscopy investigation for application in bio-nanodevices
Assembling of redox proteins on Au(111) surfaces: A scanning probe microscopy investigation for application in bio-nanodevices
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Assembling of redox proteins on Au(111) surfaces: A scanning probe microscopy investigation for application in bio-nanodevices

Andolfi, L. ; Bizzarri, A.R. ; Cannistraro, S.

Thin solid films, 2006-09, Vol.515 (1), p.212-219 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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9
Barrier layer, geometry and alloying effects on the microstructure and texture of electroplated copper thin films and damascene lines
Barrier layer, geometry and alloying effects on the microstructure and texture of electroplated copper thin films and damascene lines
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Barrier layer, geometry and alloying effects on the microstructure and texture of electroplated copper thin films and damascene lines

Muppidi, T. ; Field, D.P. ; Sanchez, J.E. ; Woo, C.

Thin solid films, 2005-01, Vol.471 (1), p.63-70 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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10
Bonding characteristics of DC magnetron sputtered B–C–N thin films investigated by Fourier-transformed infrared spectroscopy and X-ray photoelectron spectroscopy
Bonding characteristics of DC magnetron sputtered B–C–N thin films investigated by Fourier-transformed infrared spectroscopy and X-ray photoelectron spectroscopy
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Bonding characteristics of DC magnetron sputtered B–C–N thin films investigated by Fourier-transformed infrared spectroscopy and X-ray photoelectron spectroscopy

Linss, V. ; Rodil, S.E. ; Reinke, P. ; Garnier, M.G. ; Oelhafen, P. ; Kreissig, U. ; Richter, F.

Thin solid films, 2004-11, Vol.467 (1), p.76-87 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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