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Recent trends in CMOS reliability: from individual traps to circuit simulationsKaczer, B ; Toledano-Luque, M ; Franco, J ; Grasser, T ; Roussel, Ph J ; Camargo, V.V.A ; Mahato, S ; Simoen, E ; Catthoor, F ; Wirth, G.I ; Groeseneken, GIEEE International Integrated Reliability Workshop Final Report (IRW), 2011, 2012Texto completo disponível |