Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurementsBardi, U. ; Chenakin, S.P. ; Lavacchi, A. ; Pagura, C. ; Tolstogouzov, A.Applied surface science, 2006-08, Vol.252 (20), p.7373-7382 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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High-temperature oxidation of CrN/AlN multilayer coatingsBardi, U. ; Chenakin, S.P. ; Ghezzi, F. ; Giolli, C. ; Goruppa, A. ; Lavacchi, A. ; Miorin, E. ; Pagura, C. ; Tolstogouzov, A.Applied surface science, 2005-12, Vol.252 (5), p.1339-1349 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |