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Material Type: Artigo
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A Framework for Automated Detection of Power-related Software Errors in Industrial Verification ProcessesGandini, Stefano ; Ruzzarin, Walter ; Sanchez, Ernesto ; Squillero, Giovanni ; Tonda, AlbertoJournal of electronic testing, 2010-12, Vol.26 (6), p.689-697 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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A Scalable Healthcare Information System Based on a Service-oriented ArchitectureYang, Tzu-Hsiang ; Sun, Yeali S. ; Lai, FeipeiJournal of medical systems, 2011-06, Vol.35 (3), p.391-407 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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Functional Verification of DMA ControllersGrosso, Michelangelo ; Perez Holguin, Wilson Javier ; Ravotto, Danilo ; Sanchez, Ernesto ; Reorda, Matteo Sonza ; Tonda, Alberto ; Medina, Jaime VelascoJournal of electronic testing, 2011-08, Vol.27 (4), p.505-516 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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A DfT Architecture for 3D-SICs Based on a Standardizable Die WrapperMarinissen, Erik Jan ; Chi, Chun-Chuan ; Konijnenburg, Mario ; Verbree, JoukeJournal of electronic testing, 2012-02, Vol.28 (1), p.73-92 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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Software-Based Testing for System PeripheralsGrosso, M. ; Perez Holguin, W. J. ; Sanchez, E. ; Sonza Reorda, M. ; Tonda, A. ; Velasco Medina, J.Journal of electronic testing, 2012-04, Vol.28 (2), p.189-200 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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Secure JTAG Implementation Using Schnorr ProtocolDas, Amitabh ; Da Rolt, Jean ; Ghosh, Santosh ; Seys, Stefaan ; Dupuis, Sophie ; Di Natale, Giorgio ; Flottes, Marie-Lise ; Rouzeyre, Bruno ; Verbauwhede, IngridJournal of electronic testing, 2013-04, Vol.29 (2), p.193-209 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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On the Impact of Performance Faults in Modern MicroprocessorsKarimi, Naghmeh ; Maniatakos, Michail ; Tirumurti, Chandrasekharan (Chandra) ; Makris, YiorgosJournal of electronic testing, 2013-06, Vol.29 (3), p.351-366 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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On the Consolidation of Mixed Criticalities Applications on Multicore ArchitecturesEsposito, Stefano ; Violante, MassimoJournal of electronic testing, 2017-02, Vol.33 (1), p.65-76 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan AttacksRathor, Vijaypal Singh ; Garg, Bharat ; Sharma, G. K.Journal of electronic testing, 2018-12, Vol.34 (6), p.697-708 [Periódico revisado por pares]New York: Springer USTexto completo disponível |