Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Introduction to the Ferrites IssueHogan, C. LesterProceedings of the IRE, 1956-10, Vol.44 (10), p.1233-1233IEEETexto completo disponível |
2 |
Material Type: Artigo
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The High Current Limit for Semiconductor Junction DevicesFletcher, Neville H.Proceedings of the IRE, 1957-01, Vol.45 (6), p.862-872IEEETexto completo disponível |
3 |
Material Type: Artigo
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On the "Insertion-distortion factor"Cimagalli, V.I.R.E. transactions on audio, 1960-03, Vol.AU-8 (2), p.68-68IEEETexto completo disponível |
4 |
Material Type: Artigo
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Spectral response of solar-cell structuresTerman, L.M.Solid-state electronics, 1961, Vol.2 (1), p.1-7 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
5 |
Material Type: Artigo
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Contributions of Materials Technology to Semiconductor DevicesPetritz, Richard L.Proceedings of the IRE, 1962-05, Vol.50 (5), p.1025-1038IEEETexto completo disponível |
6 |
Material Type: Artigo
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Functional Components and Integrated Circuits: Invention Today Synthesis in 2012 A.DMorton, J. A.Proceedings of the IRE, 1962-05, Vol.50 (5), p.601-602IEEETexto completo disponível |
7 |
Material Type: Artigo
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Radiative recombination in germanium as an indicator of radiation damageBraunstein, R.Solid-state electronics, 1963-01, Vol.6 (4), p.349-356 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
8 |
Material Type: Artigo
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Thermo-photo-voltaic energy conversionWedlock, B.D.Proceedings of the IEEE, 1963-01, Vol.51 (5), p.694-698 [Periódico revisado por pares]IEEETexto completo disponível |
9 |
Material Type: Artigo
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A further discussion of stimulated emission of bremsstrahlungMarcuse, DietrichBell System Technical Journal, 1963-03, Vol.42 (2), p.415-430 [Periódico revisado por pares]Oxford, UK: American Telephone and Telegraph CompanyTexto completo disponível |
10 |
Material Type: Artigo
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Doping of semiconductors for injection lasersKeyes, R.W.Proceedings of the IEEE, 1963-04, Vol.51 (4), p.602-602 [Periódico revisado por pares]IEEETexto completo disponível |