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Programmable arrays mix FPGA and ASIC blocks
Programmable arrays mix FPGA and ASIC blocks
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magazinearticle 		Adicionar ao Meu Espaço

Programmable arrays mix FPGA and ASIC blocks

Bursky, Dave

Electronic design, 1996-10, Vol.44 (21), p.69

Endeavor Business Media

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2
Damage engineering and proximity gettering of metals studied by electrical measurements on Pt-contaminated diodes
Damage engineering and proximity gettering of metals studied by electrical measurements on Pt-contaminated diodes
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Artigo 		Adicionar ao Meu Espaço

Damage engineering and proximity gettering of metals studied by electrical measurements on Pt-contaminated diodes

Cacciato, A ; Raineri, V

Semiconductor science and technology, 1998-08, Vol.13 (8), p.941-949, Article 941 [Periódico revisado por pares]

Bristol: IOP Publishing

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3
ILP-based cost-optimal DSP synthesis with module selection and data format conversion
ILP-based cost-optimal DSP synthesis with module selection and data format conversion
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Artigo 		Adicionar ao Meu Espaço

ILP-based cost-optimal DSP synthesis with module selection and data format conversion

Ito, K. ; Lucke, L.E. ; Parhi, K.K.

IEEE transactions on very large scale integration (VLSI) systems, 1998-12, Vol.6 (4), p.582-594 [Periódico revisado por pares]

Piscataway, NJ: IEEE

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4
RSA cryptosystem design based on the Chinese remainder theorem
RSA cryptosystem design based on the Chinese remainder theorem
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

RSA cryptosystem design based on the Chinese remainder theorem

Wu, Chung-Hsien ; Hong, Jin-Hua ; Wu, Cheng-Wen

Proceedings of the 2001 Asia and South Pacific Design Automation Conference, 2001, p.391-395

New York, NY, USA: ACM

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5
Design of an one-cycle decompression hardware for performance increase in embedded systems
Design of an one-cycle decompression hardware for performance increase in embedded systems
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Ata de Congresso 		Adicionar ao Meu Espaço

Design of an one-cycle decompression hardware for performance increase in embedded systems

Lekatsas, Haris ; Henkel, Jörg ; Jakkula, Venkata

Annual ACM IEEE Design Automation Conference: Proceedings of the 39th conference on Design automation : New Orleans, Louisiana, USA; 10-14 June 2002, 2002, p.34-39

New York, NY, USA: ACM

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6
Piezoresistive cantilevers and measurement system for characterizing low force electrical contacts
Piezoresistive cantilevers and measurement system for characterizing low force electrical contacts
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Artigo 		Adicionar ao Meu Espaço

Piezoresistive cantilevers and measurement system for characterizing low force electrical contacts

Pruitt, Beth L. ; Kenny, Thomas W.

Sensors and actuators. A. Physical., 2003-03, Vol.104 (1), p.68-77 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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7
Enhanced model based OPC for 65nm and below
Enhanced model based OPC for 65nm and below
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Enhanced model based OPC for 65nm and below

WORD, James ; COBB, Nicolas B

SPIE proceedings series, 2004, p.1305-1314

Bellingham WA: SPIE

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8
On the generation of scan-based test sets with reachable states for testing under functional operation conditions
On the generation of scan-based test sets with reachable states for testing under functional operation conditions
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Ata de Congresso 		Adicionar ao Meu Espaço

On the generation of scan-based test sets with reachable states for testing under functional operation conditions

Pomeranz, Irith

Proceedings of the 41st annual Design Automation Conference, 2004, p.928-933

New York, NY, USA: ACM

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9
Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules
Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules
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Ata de Congresso 		Adicionar ao Meu Espaço

Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules

Wang, Hua ; Miranda, Miguel ; Dehaene, Wim ; Catthoor, Francky ; Maex, Karen

Design, Automation and Test in Europe, 2005, p.914-919

Washington, DC, USA: IEEE Computer Society

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10
Minority carrier lifetime in p-HgCdTe
Minority carrier lifetime in p-HgCdTe
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Artigo 		Adicionar ao Meu Espaço

Minority carrier lifetime in p-HgCdTe

KINCH, M. A ; AQARIDEN, F ; CHANDRA, D ; LIAO, P.-K ; SCHAAKE, H. F ; SHIH, H. D

Journal of electronic materials, 2005-06, Vol.34 (6), p.880-884 [Periódico revisado por pares]

New York, NY: Institute of Electrical and Electronics Engineers

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