Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
![]() |
Role of Mg doping on morphology and photoluminescence features of MgxZn1−xO films prepared by ultrasonic spray pyrolysisZhang, Haiming ; Zhao, Tingting ; Hu, Guofeng ; Miao, Lingling ; Yang, YanJournal of materials science. Materials in electronics, 2012, Vol.23 (11), p.1933-1937 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
2 |
Material Type: Artigo
|
![]() |
An investigation of Pb-contribution effect on the characteristic features of CdO films coated with a sol–gel spin coating techniqueTurgut, G.Journal of materials science. Materials in electronics, 2017-11, Vol.28 (22), p.16992-17001 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
3 |
Material Type: Artigo
|
![]() |
Optical features of PbBr2 semiconductor thin films for radiation attenuation applicationTorres, O. G. ; Gordillo, G. ; Plazas, M. C. ; Landínez Téllez, D. A. ; Roa-Rojas, J.Journal of materials science. Materials in electronics, 2021-06, Vol.32 (12), p.16937-16944 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
4 |
Material Type: Artigo
|
![]() |
The effect of (CeO2: PVC) thin interfacial film on the electrical features in Au/n-Si Schottky barrier diodes (SBDs) by using current–voltage measurementsGanj, Tohid ; Rozati, Seyed Mohammad ; Azizian-Kalandaragh, Yashar ; Pirgholi-Givi, Golamreza ; Altındal, ŞemsettinJournal of materials science. Materials in electronics, 2023-03, Vol.34 (8), p.752, Article 752 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
5 |
Material Type: Artigo
|
![]() |
Assessment of thermal annealing on structural, electrical, optical and surface topographical features of titania films for solar cellsAgarwal, Reema ; Himanshu ; Ameta, C. ; Dhaka, M. S.Journal of materials science. Materials in electronics, 2023-10, Vol.34 (28), p.1974, Article 1974 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
6 |
Material Type: Artigo
|
![]() |
Structural and optical features of neoteric Ag2BaGeS4 thin films synthesized by a chemical bath deposition processAl-Zahrani, H. Y. S. ; Alsulami, AbdullahJournal of materials science. Materials in electronics, 2023-07, Vol.34 (20), p.1550, Article 1550 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
7 |
Material Type: Artigo
|
![]() |
Sensitivity Features of Thin Film Plate Acoustic Wave ResonatorsArapan, L. ; Anderas, E. ; Katardjiev, I. ; Yantchev, V.IEEE sensors journal, 2011-12, Vol.11 (12), p.3330-3331 [Periódico revisado por pares]New York: IEEETexto completo disponível |
8 |
Material Type: Artigo
|
![]() |
Development of room temperature sensor based on high quality rhombohedral Al2O3:Cr2O3 (1:1) thin film with bone like morphological feature for ultrasensitive detection of NH3 gasPonmudi, S. ; Sivakumar, R. ; Sanjeeviraja, C. ; Gopalakrishnan, C. ; Okamoto, T.Journal of materials science. Materials in electronics, 2020-07, Vol.31 (13), p.10123-10141 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
9 |
Material Type: Artigo
|
![]() |
Tailoring the structural, electrical, and optical features of Erbium(III)-Tris(8-hydroxyquinolinato) nanostructured films for optical applications: effect of film thicknessAlsharari, Abdulrhman M. ; Qashou, Saleem I. ; Hamdalla, Taymour A. ; Alatawi, Naifa S. ; Alsharif, Marwah Ahmed ; Alam, Khan ; Mihaina, Ibrahim A. M. ; Qaessy, Hajeer ; Yahia, I. S. ; Darwish, A. A. A.Journal of materials science. Materials in electronics, 2022-05, Vol.33 (13), p.9966-9975 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
10 |
Material Type: Artigo
|
![]() |
The structural features of TiO2 thin films formed by pyrosol methodsROGERS, K. D ; LANE, D. W ; CHAPMAN, A. J ; PAINTER, J. D WCAJournal of materials science. Materials in electronics, 2003-09, Vol.14 (9), p.573-577 [Periódico revisado por pares]Norwell, MA: SpringerTexto completo disponível |