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1 |
Material Type: Artigo
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Role of Mg doping on morphology and photoluminescence features of MgxZn1−xO films prepared by ultrasonic spray pyrolysisZhang, Haiming ; Zhao, Tingting ; Hu, Guofeng ; Miao, Lingling ; Yang, YanJournal of materials science. Materials in electronics, 2012, Vol.23 (11), p.1933-1937 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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Material Type: Artigo
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Sustainable and Ecological Poly (Vinyl Alcohol)/Agave Fiber-Based Films: Structural Features post Composting ProcessSifuentes-Nieves, Israel ; Flores-Silva, Pamela C. ; Ledezma-Perez, Antonio S. ; Hernandez-Gamez, Jose F. ; Gonzalez-Morones, Pablo ; Saucedo-Salazar, Esmeralda ; Hernandez-Hernandez, ErnestoJournal of polymers and the environment, 2024-05, Vol.32 (5), p.2448-2456 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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An investigation of Pb-contribution effect on the characteristic features of CdO films coated with a sol–gel spin coating techniqueTurgut, G.Journal of materials science. Materials in electronics, 2017-11, Vol.28 (22), p.16992-17001 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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Optical features of PbBr2 semiconductor thin films for radiation attenuation applicationTorres, O. G. ; Gordillo, G. ; Plazas, M. C. ; Landínez Téllez, D. A. ; Roa-Rojas, J.Journal of materials science. Materials in electronics, 2021-06, Vol.32 (12), p.16937-16944 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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The effect of (CeO2: PVC) thin interfacial film on the electrical features in Au/n-Si Schottky barrier diodes (SBDs) by using current–voltage measurementsGanj, Tohid ; Rozati, Seyed Mohammad ; Azizian-Kalandaragh, Yashar ; Pirgholi-Givi, Golamreza ; Altındal, ŞemsettinJournal of materials science. Materials in electronics, 2023-03, Vol.34 (8), p.752, Article 752 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
6 |
Material Type: Artigo
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Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM)Ţălu, Ştefan ; Yadav, Ram Pratap ; Ali, Arman ; Alireza Grayeli Korpi ; Sobola, Dinara ; Ţălu, Mihai ; Rezaee, Sahare ; Achour, Amine ; Jurečka, Stanislav ; Mardani, MohsenVakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten, 2019-02, Vol.31 (1), p.30-35Weinheim: Wiley Subscription Services, IncTexto completo disponível |
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Material Type: Artigo
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Assessment of thermal annealing on structural, electrical, optical and surface topographical features of titania films for solar cellsAgarwal, Reema ; Himanshu ; Ameta, C. ; Dhaka, M. S.Journal of materials science. Materials in electronics, 2023-10, Vol.34 (28), p.1974, Article 1974 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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Structural and optical features of neoteric Ag2BaGeS4 thin films synthesized by a chemical bath deposition processAl-Zahrani, H. Y. S. ; Alsulami, AbdullahJournal of materials science. Materials in electronics, 2023-07, Vol.34 (20), p.1550, Article 1550 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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Annealing treatment on waterborne polyurethane film-forming and structural features induced heat conduction performance in conductive adhesiveLi, Rui ; Shan, ZhihuaInternational journal of adhesion and adhesives, 2022-09, Vol.117, p.103173, Article 103173 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
10 |
Material Type: Artigo
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Development of room temperature sensor based on high quality rhombohedral Al2O3:Cr2O3 (1:1) thin film with bone like morphological feature for ultrasensitive detection of NH3 gasPonmudi, S. ; Sivakumar, R. ; Sanjeeviraja, C. ; Gopalakrishnan, C. ; Okamoto, T.Journal of materials science. Materials in electronics, 2020-07, Vol.31 (13), p.10123-10141 [Periódico revisado por pares]New York: Springer USTexto completo disponível |