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1
Optical features of PbBr2 semiconductor thin films for radiation attenuation application
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Optical features of PbBr2 semiconductor thin films for radiation attenuation application

Torres, O. G. ; Gordillo, G. ; Plazas, M. C. ; Landínez Téllez, D. A. ; Roa-Rojas, J.

Journal of materials science. Materials in electronics, 2021-06, Vol.32 (12), p.16937-16944 [Periódico revisado por pares]

New York: Springer US

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2
Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM)
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Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM)

Ţălu, Ştefan ; Yadav, Ram Pratap ; Ali, Arman ; Alireza Grayeli Korpi ; Sobola, Dinara ; Ţălu, Mihai ; Rezaee, Sahare ; Achour, Amine ; Jurečka, Stanislav ; Mardani, Mohsen

Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten, 2019-02, Vol.31 (1), p.30-35

Weinheim: Wiley Subscription Services, Inc

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3
Assessment of thermal annealing on structural, electrical, optical and surface topographical features of titania films for solar cells
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Assessment of thermal annealing on structural, electrical, optical and surface topographical features of titania films for solar cells

Agarwal, Reema ; Himanshu ; Ameta, C. ; Dhaka, M. S.

Journal of materials science. Materials in electronics, 2023-10, Vol.34 (28), p.1974, Article 1974 [Periódico revisado por pares]

New York: Springer US

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4
Pulsed laser ablation of electrically insulated features in thin NiCr films
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Pulsed laser ablation of electrically insulated features in thin NiCr films

Mao, Ningyue ; Enrique, Pablo D. ; Peng, Peng

International journal of advanced manufacturing technology, 2023-10, Vol.128 (11-12), p.5167-5177 [Periódico revisado por pares]

London: Springer London

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5
Some dynamic features of ferroelectric thin films
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Some dynamic features of ferroelectric thin films

Levi, M O ; Kalinchuk, V V ; Shirokov, V B

Journal of physics. Conference series, 2019-08, Vol.1260 (9), p.92004 [Periódico revisado por pares]

Bristol: IOP Publishing

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6
Structural and optical features of neoteric Ag2BaGeS4 thin films synthesized by a chemical bath deposition process
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Structural and optical features of neoteric Ag2BaGeS4 thin films synthesized by a chemical bath deposition process

Al-Zahrani, H. Y. S. ; Alsulami, Abdullah

Journal of materials science. Materials in electronics, 2023-07, Vol.34 (20), p.1550, Article 1550 [Periódico revisado por pares]

New York: Springer US

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7
Highly Tunable MOCVD Process of Vanadium Dioxide Thin Films: Relationship between Structural/Morphological Features and Electrodynamic Properties
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Highly Tunable MOCVD Process of Vanadium Dioxide Thin Films: Relationship between Structural/Morphological Features and Electrodynamic Properties

Pellegrino, Anna Lucia ; Lo Presti, Francesca ; Papari, Gian Paolo ; Koral, Can ; Andreone, Antonello ; Malandrino, Graziella

Sensors (Basel, Switzerland), 2023-08, Vol.23 (16), p.7270 [Periódico revisado por pares]

Basel: MDPI AG

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8
Features of Sliding Friction on Thin-Film Mo–S–C Coatings Prepared by Pulsed Laser Deposition
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Features of Sliding Friction on Thin-Film Mo–S–C Coatings Prepared by Pulsed Laser Deposition

Fominski, V. Yu ; Romanov, R. I. ; Fominski, D. V. ; Novikov, S. M. ; Chesnokov, A. V.

Journal of friction and wear, 2020, Vol.41 (1), p.18-24 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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9
Features of AlN film grown by ion-plasma sputtering
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Features of AlN film grown by ion-plasma sputtering

Lubyanskiy, Ya V ; Bondarev, A D ; Soshnikov, I P ; Kotlyar, K P ; Kirilenko, D A ; Bert, N A ; Ayusheva, K R ; Tarasov, I S

Journal of physics. Conference series, 2016-08, Vol.741 (1), p.12041 [Periódico revisado por pares]

Bristol: IOP Publishing

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10
Sensitivity Features of Thin Film Plate Acoustic Wave Resonators
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Sensitivity Features of Thin Film Plate Acoustic Wave Resonators

Arapan, L. ; Anderas, E. ; Katardjiev, I. ; Yantchev, V.

IEEE sensors journal, 2011-12, Vol.11 (12), p.3330-3331 [Periódico revisado por pares]

New York: IEEE

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