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Material Type: Ata de Congresso
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Investigation of transcapillary exchange by the laser methodBAGAYEV, S. N ; FOMIN, Yu. N ; ORLOV, V. A ; PANOV, S. V ; ZAKHAROV, V. N ; METYOLKIN, M. GLaser physics, 2005, Vol.15 (9), p.1292-1298 [Periódico revisado por pares]New York, NY: SpringerSem texto completo |
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Material Type: Ata de Congresso
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Homogeneously precessing domain in 3He-B: formation and propertiesDMITRIEV, V. V ; FOMIN, I. AJournal of physics. Condensed matter (Print), 2009, Vol.21 (16) [Periódico revisado por pares]Bristol: Institute of PhysicsTexto completo disponível |
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Material Type: Ata de Congresso
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Ultra-thin SOI Layer Nanostructuring and Nanowire Transistor Formation for FemtoMole Electronic BiosensorsNaumova, Olga ; Popov, Vladimir P. ; Safronov, Leonid ; Fomin, Boris ; Nasimov, Dmitry ; Latyshev, Alexander ; Aseev, Alexander ; Ivanov, Yury ; Archakov, AlexanderECS transactions, 2009, Vol.25 (10), p.83-87Texto completo disponível |
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Material Type: Ata de Congresso
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NPDGamma: A Measurement of the Parity-Violating Gamma Asymmetry A in n-p CaptureGillis, R. C. ; Alarcon, R. ; Balascuta, S. ; Barron-Palos, L. ; Bowman, James D ; Carlini, R. D. ; Chen, W. ; Chupp, T. E. ; Crawford, C. ; Covrig, S. ; Dabaghyan, M. ; Fomin, N. ; Freedman, S. ; Gentile, T. R. ; Gericke, M. T. ; Greene, G. ; Hersman, F. W. ; Ino, T. ; Jones, G. ; Lauss, B. ; Leuschner, M. ; Lozowski, W. R. ; Mahurin, R. ; Masuda, Y. ; Mei, J. ; Mitchell, G. S. ; Muto, S. ; Nann, H. ; Page, S. A. ; Penttila, Seppo ; Ramsay, W. D. ; Salas-Bacci, A. ; Santra, S. ; Sharma, M. ; Seo, P.-N. ; Sharapov, E. I. ; Smith, T. B. ; Snow, W. M. ; Wilburn, W. S. ; Yuan, V.Journal of physics. Conference series, 2010, Vol.239 (1) [Periódico revisado por pares]United StatesTexto completo disponível |
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Material Type: Ata de Congresso
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The architecture of a software platform for growing spiking neural networks simulator developingBakhshiev, A V ; Fomin, I S ; Gundelakh, F V ; Demcheva, A A ; Korsakov, A MJournal of physics. Conference series, 2020, Vol.1679 (4), p.42001 [Periódico revisado por pares]IOP PublishingTexto completo disponível |