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Deep Sensing Approach to Single-Sensor Vehicle Weighing System on Bridges
Deep Sensing Approach to Single-Sensor Vehicle Weighing System on Bridges
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Deep Sensing Approach to Single-Sensor Vehicle Weighing System on Bridges

Kawakatsu, Takaya ; Aihara, Kenro ; Takasu, Atsuhiro ; Adachi, Jun

IEEE sensors journal, 2019-01, Vol.19 (1), p.243-256 [Periódico revisado por pares]

New York: IEEE

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Deep Learning-Based Myoelectric Potential Estimation Method for Wheelchair Operation
Deep Learning-Based Myoelectric Potential Estimation Method for Wheelchair Operation
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Deep Learning-Based Myoelectric Potential Estimation Method for Wheelchair Operation

Aihara, Shimpei ; Shibata, Ryusei ; Mizukami, Ryosuke ; Sakai, Takara ; Shionoya, Akira

Sensors (Basel, Switzerland), 2022-02, Vol.22 (4), p.1615 [Periódico revisado por pares]

Switzerland: MDPI AG

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3
Data-Driven Bridge Weigh-In-Motion
Data-Driven Bridge Weigh-In-Motion
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Data-Driven Bridge Weigh-In-Motion

Kawakatsu, Takaya ; Aihara, Kenro ; Takasu, Atsuhiro ; Nagayama, Tomonori ; Adachi, Jun

IEEE sensors journal, 2023-08, Vol.23 (15), p.1-1 [Periódico revisado por pares]

New York: IEEE

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4
ThelR547v1-An Asymmetric Dilated Convolutional Neural Network for Real-time Semantic Segmentation of Horticultural Crops
ThelR547v1-An Asymmetric Dilated Convolutional Neural Network for Real-time Semantic Segmentation of Horticultural Crops
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ThelR547v1-An Asymmetric Dilated Convolutional Neural Network for Real-time Semantic Segmentation of Horticultural Crops

Islam, Md Parvez ; Hatou, Kenji ; Aihara, Takanori ; Kawahara, Masaki ; Okamoto, Soki ; Senoo, Shuhei ; Sumire, Kirino

Sensors (Basel, Switzerland), 2022-11, Vol.22 (22), p.8807 [Periódico revisado por pares]

Switzerland: MDPI AG

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5
Development of human movement measurement device for long-term measurements
Development of human movement measurement device for long-term measurements
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Development of human movement measurement device for long-term measurements

Kamio, Chihiro ; Aihara, Tatsuhito ; Minorikawa, Gaku

Measurement : journal of the International Measurement Confederation, 2020-06, Vol.157, p.107671, Article 107671 [Periódico revisado por pares]

London: Elsevier Ltd

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6
Dynamic accuracy measurement system for mechanical wristwatch
Dynamic accuracy measurement system for mechanical wristwatch
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Dynamic accuracy measurement system for mechanical wristwatch

Aihara, Tatsuhito ; Kamio, Chihiro ; Hara, Yosuke ; Ito, Kengo ; Jujo, Koichiro

Precision engineering, 2021-07, Vol.70, p.117-123 [Periódico revisado por pares]

Elsevier Inc

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7
Design and testing of a compact non-orthogonal two-axis Lloyd's mirror interferometer for fabrication of large-area two-dimensional scale gratings
Design and testing of a compact non-orthogonal two-axis Lloyd's mirror interferometer for fabrication of large-area two-dimensional scale gratings
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Design and testing of a compact non-orthogonal two-axis Lloyd's mirror interferometer for fabrication of large-area two-dimensional scale gratings

Shimizu, Yuki ; Aihara, Ryo ; Mano, Kazuki ; Chen, Chong ; Chen, Yuan-Liu ; Chen, Xiuguo ; Gao, Wei

Precision engineering, 2018-04, Vol.52, p.138-151 [Periódico revisado por pares]

Elsevier Inc

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8
Generalized Interference Detection Scheme in Heterogeneous Low Power Wide Area Networks
Generalized Interference Detection Scheme in Heterogeneous Low Power Wide Area Networks
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Generalized Interference Detection Scheme in Heterogeneous Low Power Wide Area Networks

Aihara, Naoki ; Adachi, Koichi ; Takyu, Osamu ; Ohta, Mai ; Fujii, Takeo

IEEE sensors letters, 2020-06, Vol.4 (6), p.1-4 [Periódico revisado por pares]

Piscataway: IEEE

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9
Development of Stacked Image Sensor With Avalanche Multiplication in Surface-Enhanced Crystalline-Selenium-Based Photoconversion Layer
Development of Stacked Image Sensor With Avalanche Multiplication in Surface-Enhanced Crystalline-Selenium-Based Photoconversion Layer
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Development of Stacked Image Sensor With Avalanche Multiplication in Surface-Enhanced Crystalline-Selenium-Based Photoconversion Layer

Imura, Shigeyuki ; Mineo, Keitada ; Arai, Toshiki ; Miyakawa, Kazunori ; Kubota, Misao ; Aihara, Satoshi ; Nishimoto, Keisuke ; Sugiyama, Mutsumi ; Nanba, Masakazu

IEEE sensors letters, 2022-04, Vol.6 (4), p.1-4 [Periódico revisado por pares]

Piscataway: IEEE

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10
Reliable measurement method for complicated OPC pattern
Reliable measurement method for complicated OPC pattern
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Reliable measurement method for complicated OPC pattern

Aihara, Tastuya ; Kondo, Shinpei ; Higuchi, Masaru

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.7028, p.70281N-70281N-7

Bellingham, Wash: SPIE

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