Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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A thermodynamic model for electrical current induced damageBasaran, C. ; Minghui Lin ; Hua Ye2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546), 2004, Vol.2, p.1738-1745 Vol.2Piscataway NJ: IEEETexto completo disponível |
2 |
Material Type: Ata de Congresso
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An analytical model for thermal stress analysis of multi-layered microelectronics packagingYujun Wen ; Basaran, C.2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546), 2004, Vol.2, p.1592-1601 Vol.2Piscataway NJ: IEEETexto completo disponível |
3 |
Material Type: Ata de Congresso
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Damage mechanics of microelectronics solder joints under high current densitiesHua Ye ; Basaran, C. ; Hopkins, D.C. ; Frear, D. ; Jong-Kai Lin2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546), 2004, Vol.1, p.988-997 Vol.1Piscataway NJ: IEEETexto completo disponível |
4 |
Material Type: Artigo
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Influence of Interfacial Compliance on Thermomechanical Stresses in Multilayered Microelectronic PackagingBasaran, C. ; Yujun WenIEEE transactions on advanced packaging, 2006-11, Vol.29 (4), p.666-673Piscataway, NY: IEEETexto completo disponível |
5 |
Material Type: Artigo
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Thermomigration Versus Electromigration in Microelectronics Solder JointsAbdulhamid, M.F. ; Basaran, C. ; Yi-Shao LaiIEEE transactions on advanced packaging, 2009-08, Vol.32 (3), p.627-635Piscataway, NJ: IEEETexto completo disponível |