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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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DECISIVE: Designing Critical Systems With Iterative Automated Safety AnalysisWei, Ran ; Jiang, Zhe ; Guo, Xiaoran ; Yang, Ruizhe ; Mei, Haitao ; Zolotas, Athanasios ; Kelly, TimIEEE transactions on computer-aided design of integrated circuits and systems, 2024-05, Vol.43 (5), p.1346-1359 [Periódico revisado por pares]New York: IEEETexto completo disponível |
| 2 |
Material Type: Artigo
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Bridging the Pragmatic Gaps for Mixed-Criticality Systems in the Automotive IndustryJiang, Zhe ; Zhao, Shuai ; Wei, Ran ; Yang, Dawei ; Paterson, Richard ; Guan, Nan ; Zhuang, Yan ; Audsley, Neil C.IEEE transactions on computer-aided design of integrated circuits and systems, 2022-04, Vol.41 (4), p.1116-1129 [Periódico revisado por pares]New York: IEEETexto completo disponível |
| 3 |
Material Type: Artigo
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Minimizing Development Cost With Reliability Goal for Automotive Functional Safety During Design PhaseXie, Guoqi ; Chen, Yuekun ; Liu, Yan ; Li, Renfa ; Li, KeqinIEEE transactions on reliability, 2018-03, Vol.67 (1), p.196-211 [Periódico revisado por pares]New York: IEEETexto completo disponível |
| 4 |
Material Type: Ata de Congresso
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ASIL-Decomposition Based Routing and Scheduling in Safety-Critical Time-Sensitive NetworkingZhou, Yuanbin ; Samii, Soheil ; Eles, Petru ; Peng, Zebo2021 IEEE 27th Real-Time and Embedded Technology and Applications Symposium (RTAS), 2021, p.184-195IEEESem texto completo |
| 5 |
Material Type: Ata de Congresso
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Innovation Practices Track: VLSI Functional SafetySu, Fei ; Nitzan, Meirav ; Sethi, Ankush ; Kumar, Vaibhav ; Alexandrescu, Dan2023 IEEE 41st VLSI Test Symposium (VTS), 2023, p.1-1IEEESem texto completo |
| 6 |
Material Type: Artigo
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Fitting Software Execution-Time Exceedance into a Residual Random Fault in ISO-26262Agirre, Irune ; Cazorla, Francisco J. ; Abella, Jaume ; Hernandez, Carles ; Mezzetti, Enrico ; Azkarate-askatsua, Mikel ; Vardanega, TullioIEEE transactions on reliability, 2018-09, Vol.67 (3), p.1314-1327 [Periódico revisado por pares]New York: IEEETexto completo disponível |
| 7 |
Material Type: Ata de Congresso
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Radian: Paperless Academic Testimonials Enabled for Long-Term ValidationPan, Souvik ; Saha, Dhiman ; Moona, Rajat2023 15th International Conference on COMmunication Systems & NETworkS (COMSNETS), 2023, p.189-191IEEESem texto completo |
| 8 |
Material Type: Artigo
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SAT-Based Fault Equivalence Checking in Functional Safety VerificationDao, Ai Quoc ; Lin, Mark Po-Hung ; Mishchenko, AlanIEEE transactions on computer-aided design of integrated circuits and systems, 2018-12, Vol.37 (12), p.3198-3205 [Periódico revisado por pares]New York: IEEETexto completo disponível |
| 9 |
Material Type: Ata de Congresso
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ProFace: A Cancelable Face Template Protection ApproachGarg, Surabhi ; Jindal, Arun Kumar ; MA, Rajan ; Chalamala, Srinivasa Rao2023 15th International Conference on COMmunication Systems & NETworkS (COMSNETS), 2023, p.147-152IEEESem texto completo |
| 10 |
Material Type: Ata de Congresso
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DIST: Deterministic In-System Test with X-maskingMrugalski, Grzegorz ; Rajski, Janusz ; Tyszer, Jerzy ; Wlodarczak, Bartosz2022 IEEE International Test Conference (ITC), 2022, p.20-27IEEESem texto completo |
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