A new method for determination of the fixed charge density at the buried oxide/underlying substrate interface in accumulation-mode P-channel SOI MOSFETs. (em CD-Rom)
João Antonio Martino 1959- Marcelo Antonio Pavanello; Conference of the Brazilian Microelectronics Society (12. 1997 Caxambu)
Proceedings Itajubá : SBMICRO/EFEI, 1997
Itajubá SBMICRO/EFEI 1997
Item não circula. Consulte sua biblioteca.(Acessar)
A new method to extract the LDD doping concentration on fully depleted SOI nMOSFET at 300 K
Aparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; IEEE International Conference on Devices, Circuits and Syems (3. 2000 Cancun)
Proceedings Piscataway : IEEE, 2000
Piscataway IEEE 2000
Item não circula. Consulte sua biblioteca.(Acessar)
Influence of the substrate potential drop on fully depleted soi mesfet threshold voltage at 77k
Marcelo Antonio Pavanello João Antonio Martino 1959-; Congress of the Brazilian Microelectronics Society (10. 1995 Canela); Ibero-American Microelectronics Conference (1. 1995 Canela)
Proceedings Porto Alegre : Instituto de Informatica da Ufrgs, 1995
Porto Alegre Instituto de Informatica da Ufrgs 1995
Item não circula. Consulte sua biblioteca.(Acessar)